Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54426
DC FieldValueLanguage
dc.contributor.authorPadrón, Miguel A.en_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2019-02-18T10:44:41Z-
dc.date.available2019-02-18T10:44:41Z-
dc.date.issued2007en_US
dc.identifier.issn0378-4754en_US
dc.identifier.urihttp://hdl.handle.net/10553/54426-
dc.description.abstractThe triangle longest-edge bisection constitutes an efficient scheme for refining a mesh by reducing the obtuse triangles, since the largest interior angles are subdivided. One of these schemes is the four-triangle longest-edge (4T-LE) partition. Moreover, the four triangle self-similar (4T-SS) partition of an acute triangle yields four sub-triangles similar to the original one. In this paper we present a hybrid scheme combining the 4T-LE and the 4T-SS partitions which use the longest-edge based refinement. Numerical experiments illustrate improvement in angles and quality. The benefits of the algorithm suggest its use as an efficient tool for mesh refinement in the context of Finite Element computations.en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics and Computers in Simulation [ISSN 0378-4754], v. 75, p. 251-262en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherMesh qualityen_US
dc.subject.otherUniform refinementen_US
dc.subject.otherLongest-edge based algorithmsen_US
dc.titleRefinement based on longest-edge and self-similar four-triangle partitionsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.relation.conference4th Conference on Applied Scientific Computing and Tools, Grid Generation, Approximation and Visualization
dc.identifier.doi10.1016/j.matcom.2006.12.010
dc.identifier.scopus34547952406-
dc.identifier.isi000249494200010-
dc.contributor.authorscopusid6603825227-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid7006613647-
dc.description.lastpage262-
dc.description.firstpage251-
dc.relation.volume75-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000249494200010-
dc.contributor.daisngid3168114-
dc.contributor.daisngid1080382-
dc.contributor.daisngid259483-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.externalWOS:000249494200010-
dc.identifier.externalWOS:000249494200010-
dc.identifier.externalWOS:000249494200010-
dc.contributor.wosstandardWOS:Padron, MA
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Plaza, A
dc.date.coverdateSeptiembre 2007
dc.identifier.conferenceidevents120573
dc.identifier.ulpgces
dc.description.jcr0,738
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate25-11-2004-
crisitem.event.eventsenddate27-11-2004-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
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