Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54361
DC FieldValueLanguage
dc.contributor.authorPadrón, Miguel A.en_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.date.accessioned2019-02-18T10:19:06Z-
dc.date.available2019-02-18T10:19:06Z-
dc.date.issued2005en_US
dc.identifier.issn0168-9274en_US
dc.identifier.urihttp://hdl.handle.net/10553/54361-
dc.description.abstractIn the last years many different strategies have been developed to locally refine triangular and tetrahedral meshes. In three dimensions, many algorithms can be seen as a generalization of their respective counterparts in two dimensions. In this paper we study and compare three of the main algorithms used in the literature for the refinement of tetrahedral grids: Rivara–Levin, Plaza–Carey and Liu–Joe. We find out whether they are equivalent or not, and in what conditions the quality of the tetrahedra is also compared. We present numerical examples that support our study and that provide to engineers with practical notes for their numerical applications.en_US
dc.languageengen_US
dc.relation.ispartofApplied Numerical Mathematicsen_US
dc.sourceApplied Numerical Mathematics [ISSN 0168-9274], v. 55, p. 357-367en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherMeshen_US
dc.subject.otherRefinementen_US
dc.subject.otherAdaptivityen_US
dc.subject.otherTetrahedraen_US
dc.titleA comparative study between some bisection based partitions in 3Den_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conferenceMeeting on Applied Scientific Computing and Tools (MASCOT03)
dc.relation.conferenceApplied Scientific Computing: Recent Approaches to Grid Generation, Approximation and Numerical Modelling
dc.identifier.doi10.1016/j.apnum.2005.04.035
dc.identifier.scopus24644475906-
dc.identifier.isi000232244500009-
dc.contributor.authorscopusid6603825227-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid7006613647-
dc.description.lastpage367-
dc.description.firstpage357-
dc.relation.volume55-
dc.investigacionCienciasen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000232244500009-
dc.contributor.daisngid3168114-
dc.contributor.daisngid1080382-
dc.contributor.daisngid259483-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.externalWOS:000232244500009-
dc.contributor.wosstandardWOS:Padron, MA
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Plaza, A
dc.date.coverdateNoviembre 2005
dc.identifier.conferenceidevents120468
dc.identifier.ulpgces
dc.description.jcr0,589
dc.description.jcrqQ3
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate03-10-2003-
crisitem.event.eventsstartdate03-10-2003-
crisitem.event.eventsenddate04-10-2003-
crisitem.event.eventsenddate04-10-2003-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
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