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Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/54351
DC FieldValueLanguage
dc.contributor.authorPlaza, A.en_US
dc.contributor.authorSuárez, J. P.en_US
dc.contributor.authorPadrón, M. A.en_US
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.date.accessioned2019-02-18T10:16:12Z-
dc.date.available2019-02-18T10:16:12Z-
dc.date.issued2005en_US
dc.identifier.issn0177-0667en_US
dc.identifier.urihttp://hdl.handle.net/10553/54351-
dc.description.abstractIn this paper we explain the fractal geometry of refined and derefined triangular and tetrahedral meshes by means of the application of iterated function systems (IFS). These meshes feature a remarkable amplifying invariance under changes of scale. The applications of IFS families are shown equivalent to the use of adaptive strategies that combine the refinement procedure with the derefinement procedure. In addition, space-filling curves (SFC) are used to assign a binary code for any 2D triangular refined mesh. SFC are also shown as useful for the problem of automatic domain decomposition.en_US
dc.languageengen_US
dc.relation.ispartofEngineering with Computersen_US
dc.sourceEngineering with Computers [ISSN 0177-0667], v. 20 (4), p. 323-332en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherIterated function systemsen_US
dc.subject.otherLocal refinementen_US
dc.subject.otherSimplicial gridsen_US
dc.subject.otherBisectionen_US
dc.subject.otherSpace-filling curvesen_US
dc.titleFractality of refined triangular grids and space-filling curvesen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s00366-004-0301-7
dc.identifier.scopus23144437028-
dc.identifier.isi000230903100004-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid6603825227-
dc.description.lastpage332-
dc.identifier.issue4-
dc.description.firstpage323-
dc.relation.volume20-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000230903100004-
dc.contributor.daisngid259483-
dc.contributor.daisngid1080382-
dc.contributor.daisngid3168114-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.externalWOS:000230903100004-
dc.identifier.externalWOS:000230903100004-
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Padron, MA
dc.date.coverdateAgosto 2005
dc.identifier.ulpgcSíes
dc.description.jcr0,176
dc.description.jcrqQ4
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
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