Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/54342
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Plaza, Ángel | en_US |
dc.contributor.author | Suárez, José P. | en_US |
dc.contributor.author | Padrón, Miguel A. | en_US |
dc.contributor.author | Falcón, Sergio | en_US |
dc.contributor.author | Amieiro, Daniel | en_US |
dc.contributor.other | Suarez, Jose Pablo | - |
dc.contributor.other | PLAZA, ANGEL | - |
dc.date.accessioned | 2019-02-18T10:12:11Z | - |
dc.date.available | 2019-02-18T10:12:11Z | - |
dc.date.issued | 2004 | en_US |
dc.identifier.issn | 0167-8396 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/54342 | - |
dc.description.abstract | The four-triangles longest-edge (4T-LE) partition of a triangle t is obtained by joining the midpoint of the longest edge of t to the opposite vertex and to the midpoints of the two remaining edges. The so-called self-improvement property of the refinement algorithm based on the 4-triangles longest-edge partition is discussed and delimited by studying the number of dissimilar triangles arising from the 4T-LE partition of an initial triangle and its successors. In addition, some geometrical properties such as the number of triangles in each similarity class per mesh level and new bounds on the maximum of the smallest angles and on the second largest angles are deduced. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Computer Aided Geometric Design | en_US |
dc.source | Computer Aided Geometric Design [ISSN 0167-8396], v. 21 (4), p. 353-369 | en_US |
dc.subject | 120601 Construcción de algoritmos | en_US |
dc.subject.other | Refinement | en_US |
dc.subject.other | Longest-edge based algorithms | en_US |
dc.subject.other | Mesh quality | en_US |
dc.subject.other | Similarity classes | en_US |
dc.title | Mesh quality improvement and other properties in the four-triangles longest-edge partition | en_US |
dc.type | info:eu-repo/semantics/Article | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.cagd.2004.01.001 | |
dc.identifier.scopus | 1842558612 | - |
dc.identifier.isi | 000220780000003 | - |
dc.contributor.authorscopusid | 7006613647 | - |
dc.contributor.authorscopusid | 7202040282 | - |
dc.contributor.authorscopusid | 6603825227 | - |
dc.contributor.authorscopusid | 6602997880 | - |
dc.contributor.authorscopusid | 6504163535 | - |
dc.description.lastpage | 369 | - |
dc.identifier.issue | 4 | - |
dc.description.firstpage | 353 | - |
dc.relation.volume | 21 | - |
dc.investigacion | Ciencias | en_US |
dc.type2 | Artículo | en_US |
dc.identifier.wos | WOS:000220780000003 | - |
dc.contributor.daisngid | 259483 | - |
dc.contributor.daisngid | 1080382 | - |
dc.contributor.daisngid | 3168114 | - |
dc.contributor.daisngid | 809328 | - |
dc.contributor.daisngid | 27110755 | - |
dc.identifier.investigatorRID | C-1092-2012 | - |
dc.identifier.investigatorRID | A-8210-2008 | - |
dc.identifier.external | WOS:000220780000003 | - |
dc.identifier.external | WOS:000220780000003 | - |
dc.contributor.wosstandard | WOS:Plaza, A | |
dc.contributor.wosstandard | WOS:Suarez, JP | |
dc.contributor.wosstandard | WOS:Padron, MA | |
dc.contributor.wosstandard | WOS:Falcon, S | |
dc.contributor.wosstandard | WOS:Amieiro, D | |
dc.date.coverdate | Abril 2004 | |
dc.identifier.ulpgc | Sí | es |
dc.description.jcr | 0,916 | |
dc.description.jcrq | Q1 | |
dc.description.scie | SCIE | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Matemáticas | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Cartografía y Expresión Gráfica en La Ingeniería | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Civil | - |
crisitem.author.orcid | 0000-0002-5077-6531 | - |
crisitem.author.orcid | 0000-0001-8140-9008 | - |
crisitem.author.orcid | 0000-0001-5493-3090 | - |
crisitem.author.orcid | 0000-0001-9917-3101 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Plaza De La Hoz, Ángel | - |
crisitem.author.fullName | Suárez Rivero, José Pablo | - |
crisitem.author.fullName | Padrón Medina, Miguel Ángel | - |
crisitem.author.fullName | Falcón Santana, Sergio | - |
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