Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/52324
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dc.contributor.authorGutiérrez, Íñigoen_US
dc.contributor.authorMeléndez, Juanen_US
dc.contributor.authorGarcía, Javieren_US
dc.contributor.authorAdín, Iñigoen_US
dc.contributor.authorBistué, Guillermoen_US
dc.contributor.authorDe Nó, Joaquínen_US
dc.date.accessioned2018-11-25T19:20:29Z-
dc.date.available2018-11-25T19:20:29Z-
dc.date.issued2005en_US
dc.identifier.issn1548-0992en_US
dc.identifier.urihttp://hdl.handle.net/10553/52324-
dc.description.abstractIn this paper the reliability verification in a measurement system of passive components is presented, the passive components measured are integrated varactors. The measurement system used for the characterization of the varactors consists of the HP8719ES Vector Network Analyzer. To calibrate the measurement system, the short-open-load-through (SOLT) was used. The varactors have been designed with measurement structures in order to use the Cascade ACP40 GSG microprobes. The de-embedding process is used to move the measurement reference plane from the calibration point (probe tips) to the DUT (Device Under Test). For this work, it was used the Four Step De -embedding method but after making the necessary measurements the method has been simplified by not taking into account the coupling between signals due to tits very low value. Also, the characterization of the connections leads has not been done using the test structures but using the design rules. Due to the measurement system introduces uncertainty in the varactor measure, is necessary design some tests in order to calculate the error. In this paper these tests are defined.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Latin America Transactionsen_US
dc.sourceIEEE Latin America Transactions[ISSN 1548-0992],v. 3 (1642424), p. 317-322en_US
dc.subject3325 Tecnología de las telecomunicacionesen_US
dc.subject.otherVaractorsen_US
dc.subject.otherRadio Frequencyen_US
dc.subject.otherImpedanceen_US
dc.subject.otherReliabilityen_US
dc.subject.otherDe-embedingen_US
dc.titleReliability verification in a measurement system of integrated varactors for RF applicationsen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.identifier.doi10.1109/TLA.2005.1642424en_US
dc.identifier.scopus77957788597-
dc.contributor.authorscopusid7005865313-
dc.contributor.authorscopusid57205968075-
dc.contributor.authorscopusid7005849367-
dc.contributor.authorscopusid8383160900-
dc.contributor.authorscopusid23003561000-
dc.contributor.authorscopusid11044029300-
dc.contributor.authorscopusid6506904892-
dc.description.lastpage322en_US
dc.identifier.issue1642424-
dc.description.firstpage317en_US
dc.relation.volume3en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateDiciembre 2005en_US
dc.identifier.ulpgces
dc.description.scieSCIE
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-3561-0135-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameGarcía García, Javier Agustín-
Appears in Collections:Actas de congresos
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