Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/51600
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Plaza, Ángel | en_US |
dc.date.accessioned | 2018-11-25T02:04:01Z | - |
dc.date.available | 2018-11-25T02:04:01Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.issn | 0025-570X | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/51600 | - |
dc.description.abstract | Resumen en pdf adjunto | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Mathematics Magazine | en_US |
dc.source | Mathematics Magazine [ISSN 0025-570X], v. 89 (3), p. 189 | en_US |
dc.subject | 120222 Series, sumabilidad | en_US |
dc.title | Proof without words : limit of a recursive arithmetic mean | en_US |
dc.type | info:eu-repo/semantics/Article | es |
dc.type | Article | es |
dc.identifier.doi | 10.4169/math.mag.89.3.189 | |
dc.identifier.scopus | 84995776239 | - |
dc.contributor.authorscopusid | 7006613647 | - |
dc.identifier.eissn | 1930-0980 | - |
dc.description.lastpage | 189 | - |
dc.identifier.issue | 3 | - |
dc.description.firstpage | 189 | - |
dc.relation.volume | 89 | - |
dc.investigacion | Ciencias | en_US |
dc.type2 | Artículo | en_US |
dc.date.coverdate | Enero 2016 | |
dc.identifier.ulpgc | Sí | es |
dc.description.sjr | 0,148 | |
dc.description.sjrq | Q4 | |
item.grantfulltext | open | - |
item.fulltext | Con texto completo | - |
crisitem.author.dept | GIR IUMA: Matemáticas, Gráficos y Computación | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Matemáticas | - |
crisitem.author.orcid | 0000-0002-5077-6531 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Plaza De La Hoz, Ángel | - |
Appears in Collections: | Artículos |
Page view(s)
95
checked on May 18, 2024
Download(s)
182
checked on May 18, 2024
Google ScholarTM
Check
Altmetric
Share
Export metadata
Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.