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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/50354
DC FieldValueLanguage
dc.contributor.authorCintra, Renato J.
dc.contributor.authorFrery, Alejandro C.
dc.contributor.authorNascimento, Abraão D C
dc.contributor.otherNascimento, Abraao
dc.contributor.otherCintra, Renato
dc.contributor.otherFrery, Alejandro
dc.contributor.otherHashim, Mazlan
dc.date.accessioned2018-11-24T15:23:25Z-
dc.date.available2018-11-24T15:23:25Z-
dc.date.issued2013
dc.identifier.issn1433-7541
dc.identifier.urihttp://hdl.handle.net/10553/50354-
dc.publisher1433-7541
dc.relation.ispartofPattern Analysis and Applications
dc.sourcePattern Analysis and Applications[ISSN 1433-7541],v. 16, p. 141-161
dc.titleParametric and nonparametric tests for speckled imagery
dc.typeinfo:eu-repo/semantics/articlees
dc.typeArticlees
dc.identifier.doi10.1007/s10044-011-0249-3
dc.identifier.scopus84876094659
dc.identifier.isi000317740600002
dcterms.isPartOfPattern Analysis And Applications
dcterms.sourcePattern Analysis And Applications[ISSN 1433-7541],v. 16 (2), p. 141-161
dc.contributor.authorscopusid55930266600
dc.contributor.authorscopusid7003561251
dc.contributor.authorscopusid35264620800
dc.description.lastpage161
dc.description.firstpage141
dc.relation.volume16
dc.type2Artículoes
dc.identifier.wosWOS:000317740600002
dc.contributor.daisngid342629
dc.contributor.daisngid215914
dc.contributor.daisngid2849344
dc.identifier.investigatorRIDD-9778-2012
dc.identifier.investigatorRIDD-1288-2011
dc.identifier.investigatorRIDA-8855-2008
dc.identifier.investigatorRIDJ-7291-2012
dc.identifier.ulpgcSíes
dc.description.sjr0,47
dc.description.jcr0,742
dc.description.sjrqQ3
dc.description.jcrqQ3
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.fullNameC. Frery, Alejandro-
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