Please use this identifier to cite or link to this item:
https://accedacris.ulpgc.es/handle/10553/50354
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cintra, Renato J. | |
| dc.contributor.author | Frery, Alejandro C. | |
| dc.contributor.author | Nascimento, Abraão D C | |
| dc.contributor.other | Nascimento, Abraao | |
| dc.contributor.other | Cintra, Renato | |
| dc.contributor.other | Frery, Alejandro | |
| dc.contributor.other | Hashim, Mazlan | |
| dc.date.accessioned | 2018-11-24T15:23:25Z | - |
| dc.date.available | 2018-11-24T15:23:25Z | - |
| dc.date.issued | 2013 | |
| dc.identifier.issn | 1433-7541 | |
| dc.identifier.uri | https://accedacris.ulpgc.es/handle/10553/50354 | - |
| dc.publisher | 1433-7541 | |
| dc.relation.ispartof | Pattern Analysis and Applications | |
| dc.source | Pattern Analysis and Applications[ISSN 1433-7541],v. 16, p. 141-161 | |
| dc.title | Parametric and nonparametric tests for speckled imagery | |
| dc.type | info:eu-repo/semantics/article | es |
| dc.type | Article | es |
| dc.identifier.doi | 10.1007/s10044-011-0249-3 | |
| dc.identifier.scopus | 84876094659 | |
| dc.identifier.isi | 000317740600002 | |
| dcterms.isPartOf | Pattern Analysis And Applications | |
| dcterms.source | Pattern Analysis And Applications[ISSN 1433-7541],v. 16 (2), p. 141-161 | |
| dc.contributor.authorscopusid | 55930266600 | |
| dc.contributor.authorscopusid | 7003561251 | |
| dc.contributor.authorscopusid | 35264620800 | |
| dc.description.lastpage | 161 | |
| dc.description.firstpage | 141 | |
| dc.relation.volume | 16 | |
| dc.type2 | Artículo | es |
| dc.identifier.wos | WOS:000317740600002 | |
| dc.contributor.daisngid | 342629 | |
| dc.contributor.daisngid | 215914 | |
| dc.contributor.daisngid | 2849344 | |
| dc.identifier.investigatorRID | D-9778-2012 | |
| dc.identifier.investigatorRID | D-1288-2011 | |
| dc.identifier.investigatorRID | A-8855-2008 | |
| dc.identifier.investigatorRID | J-7291-2012 | |
| dc.identifier.ulpgc | Sí | es |
| dc.description.sjr | 0,47 | |
| dc.description.jcr | 0,742 | |
| dc.description.sjrq | Q3 | |
| dc.description.jcrq | Q3 | |
| dc.description.scie | SCIE | |
| item.grantfulltext | none | - |
| item.fulltext | Sin texto completo | - |
| crisitem.author.orcid | 0000-0002-8002-5341 | - |
| crisitem.author.fullName | C. Frery, Alejandro | - |
| Appears in Collections: | Artículos | |
SCOPUSTM
Citations
13
checked on Mar 30, 2025
WEB OF SCIENCETM
Citations
13
checked on Mar 30, 2025
Page view(s)
72
checked on Jan 18, 2025
Google ScholarTM
Check
Altmetric
Share
Export metadata
Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.