Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/49697
Campo DC Valoridioma
dc.contributor.authorMontiel-Nelson, Juan A.en_US
dc.contributor.authorNooshabadi, Saeiden_US
dc.contributor.authorEshraghian, Kamranen_US
dc.date.accessioned2018-11-24T09:58:39Z-
dc.date.available2018-11-24T09:58:39Z-
dc.date.issued1997en_US
dc.identifier.isbn0-7803-3583-Xen_US
dc.identifier.issn0271-4310en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/49697-
dc.description.abstractA GaAs logic family using the feed through evaluation concept is presented. The logic outputs reset to low during the high phase of the clock and evaluate during the low phase of the clock. Resetting to low alleviates the problems of charge-sharing and leakage current associated with other GaAs dynamic logic families. This novel concept is compared with other common GaAs logic circuits in terms of, device count, chip area, delay, clock rate and power consumption.en_US
dc.languageengen_US
dc.relation.ispartofProceedings - IEEE International Symposium on Circuits and Systemsen_US
dc.sourceProceedings - IEEE International Symposium on Circuits and Systems[ISSN 0271-4310],v. 3, p. 1884-1887en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherGallium arsenideen_US
dc.subject.otherClocksen_US
dc.subject.otherEnergy consumptionen_US
dc.subject.otherAddersen_US
dc.subject.otherLogic devicesen_US
dc.subject.otherPulse invertersen_US
dc.subject.otherMicroelectronicsen_US
dc.titleGallium arsenide based fast feed through logic (FTL)en_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conferenceProceedings of the 1997 IEEE International Symposium on Circuits and Systems, ISCAS'97. Part 4 (of 4)en_US
dc.identifier.scopus0030655447-
dc.identifier.isiA1997BJ47Z00472-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid6602486254-
dc.contributor.authorscopusid7007041524-
dc.description.lastpage1887en_US
dc.description.firstpage1884en_US
dc.relation.volume3en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid480589-
dc.contributor.daisngid20385918-
dc.contributor.daisngid9849874-
dc.description.numberofpages4en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:MontielNelson, JA-
dc.contributor.wosstandardWOS:Nooshabadi, S-
dc.contributor.wosstandardWOS:Eshraghian, K-
dc.date.coverdateEnero 1997en_US
dc.identifier.conferenceidevents121232-
dc.identifier.ulpgces
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate09-06-1997-
crisitem.event.eventsenddate12-06-1997-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
Colección:Actas de congresos
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