Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49690
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dc.contributor.authorMontiel-Nelson, Juan A.en_US
dc.contributor.authorNavarro Botello,Héctoren_US
dc.contributor.authorGarcía, José C.en_US
dc.contributor.authorSosa González, Carlos Javieren_US
dc.date.accessioned2018-11-24T09:55:19Z-
dc.date.available2018-11-24T09:55:19Z-
dc.date.issued2004en_US
dc.identifier.isbn0769520936en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/49690-
dc.description.abstractIn this paper, a functional vector generation method to maximize the data path coverage of a combinational circuit is introduced. We present a new gate model based on sensitization requirements for transition propagation, and introduce a new methodology to obtain functional vectors of maximum coverage based on Mixed Integer Linear Programming (MILP). Performance comparison and results based on a large set of MCNC'91 [1] benchmark circuits are given. Experimental results show significant speedups over a greedy SAT method.en_US
dc.languageengen_US
dc.relation.ispartofProceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004en_US
dc.sourceProceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004, p. 217-222en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherVectorsen_US
dc.subject.othermixed integer linear programming (MILP)en_US
dc.subject.otherCombinational circuitsen_US
dc.subject.otherMicroelectronicsen_US
dc.subject.otherCircuit simulationen_US
dc.subject.otherCircuit testingen_US
dc.subject.otherComputer bugsen_US
dc.titleFunctional vector generation for combinational circuits based on data path coverage metric and mixed integer linear programmingen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conferenceProceedings - 5th International Symposium on Quality Electronic Design, ISQED 2004en_US
dc.identifier.doi10.1109/ISQED.2004.1283676en_US
dc.identifier.scopus2942657477-
dc.identifier.isi000221356900036-
dc.contributor.authorscopusid7006310063-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid23028289000-
dc.contributor.authorscopusid9639270900-
dc.description.lastpage222en_US
dc.description.firstpage217en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid15044377-
dc.contributor.daisngid480589-
dc.contributor.daisngid15263850-
dc.contributor.daisngid3023904-
dc.description.numberofpages6en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Sosa, J-
dc.contributor.wosstandardWOS:Montiel-Nelson, JA-
dc.contributor.wosstandardWOS:Navarro, H-
dc.contributor.wosstandardWOS:Garcia, JC-
dc.date.coverdateEnero 2004en_US
dc.identifier.conferenceidevents120400-
dc.identifier.ulpgces
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.event.eventsstartdate22-03-2004-
crisitem.event.eventsenddate24-03-2004-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Equipos y Sistemas de Comunicación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
crisitem.author.fullNameNavarro Botello,Héctor-
crisitem.author.fullNameGarcía Montesdeoca,José Carlos-
crisitem.author.fullNameSosa González, Carlos Javier-
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