Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49650
DC FieldValueLanguage
dc.contributor.authorSosa, J.en_US
dc.contributor.authorMontiel-Nelson, Juan A.en_US
dc.contributor.authorNooshabadi, Saeiden_US
dc.contributor.otherMontiel-Nelson, Juan-
dc.date.accessioned2018-11-24T09:37:26Z-
dc.date.available2018-11-24T09:37:26Z-
dc.date.issued2010en_US
dc.identifier.issn0026-2692en_US
dc.identifier.urihttp://hdl.handle.net/10553/49650-
dc.description.abstractThis paper presents a novel methodology to obtain the entire power consumption versus delay tradeoff curve for the critical paths of a combinational logic circuit in a very efficient way using the genetic algorithm (GA). In order to evaluate the proposed algorithm the most representative set of two-level and multi-level networks from the MCNC91 benchmark suite were processed. The required computational effort, measured in terms of CPU time, is several times better for the proposed GA optimization technique than liner programming (LP) technique. On the other hand, the optimal design points obtained by the GA and LP techniques are very close to each other to within 0.3%.en_US
dc.languageengen_US
dc.publisher0026-2692-
dc.relation.ispartofMicroelectronicsen_US
dc.sourceMicroelectronics Journal[ISSN 0026-2692],v. 41, p. 135-141en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherPower optimizationen_US
dc.subject.otherGate sizingen_US
dc.subject.otherTradeoff curveen_US
dc.subject.otherGenetic algorithmsen_US
dc.subject.otherLinear programmingen_US
dc.titleApplication of genetic algorithm in computing the tradeoffs between power consumption versus delay in digital integrated circuit designen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.mejo.2010.01.010en_US
dc.identifier.scopus77649179436-
dc.identifier.isi000276798700009-
dcterms.isPartOfMicroelectronics Journal-
dcterms.sourceMicroelectronics Journal[ISSN 0026-2692],v. 41 (2-3), p. 135-141-
dc.contributor.authorscopusid7006310063-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid6602486254-
dc.description.lastpage141en_US
dc.description.firstpage135en_US
dc.relation.volume41en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000276798700009-
dc.contributor.daisngid1739656-
dc.contributor.daisngid480589-
dc.contributor.daisngid184255-
dc.identifier.investigatorRIDK-6805-2013-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Sosa, J-
dc.contributor.wosstandardWOS:Montiel-Nelson, JA-
dc.contributor.wosstandardWOS:Nooshabadi, S-
dc.date.coverdateFebrero 2010en_US
dc.identifier.ulpgces
dc.description.jcr0,789
dc.description.jcrqQ3
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSosa González, Carlos Javier-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
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