Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49298
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dc.contributor.authorBautista, Tomásen_US
dc.contributor.authorNúñez, Antonioen_US
dc.date.accessioned2018-11-24T06:02:19Z-
dc.date.available2018-11-24T06:02:19Z-
dc.date.issued2000en_US
dc.identifier.isbn0769505252en_US
dc.identifier.issn1948-3287en_US
dc.identifier.urihttp://hdl.handle.net/10553/49298-
dc.description.abstractA complete quantitative evaluation of the quality of more than one hundred implementations of SPARC processor core and its related circuitry, synthesized from VHDL descriptions, is presented in this paper as a demonstration example for selecting benchmark circuits, synthesis experiments with different tools and technologies, and performance metrics, for evaluating the quality of IP blocks and megacells. The methodology of the experiments conducted for these circuits can be applied to a wide range of other benchmark candidate circuits. The synthesis experiments are designed to fully explore the synthesis space and to analyze the impact of every synthesis step on the final design quality obtained.en_US
dc.languageengen_US
dc.relation.ispartofProceedings - International Symposium on Quality Electronic Design, ISQEDen_US
dc.sourceProceedings - International Symposium on Quality Electronic Design, ISQED[ISSN 1948-3287],v. 2000-January (838875), p. 217-226en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherVHDL synthesisen_US
dc.subject.otherHardware design languagesen_US
dc.subject.otherEnergy consumptionen_US
dc.subject.otherSpace technologyen_US
dc.subject.otherSpace explorationen_US
dc.subject.otherMicroelectronicsen_US
dc.subject.otherMeasurementen_US
dc.titleSynthesis experiments and performance metrics for evaluating the quality of IP blocks and megacellsen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference1st IEEE International Symposium on Quality Electronic Design, ISQED 2000en_US
dc.identifier.doi10.1109/ISQED.2000.838875en_US
dc.identifier.scopus84950149426-
dc.contributor.authorscopusid6603190709-
dc.contributor.authorscopusid7103279517-
dc.description.lastpage226en_US
dc.identifier.issue838875-
dc.description.firstpage217en_US
dc.relation.volume2000-Januaryen_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateEnero 2000en_US
dc.identifier.conferenceidevents121561-
dc.identifier.ulpgces
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate20-03-2000-
crisitem.event.eventsenddate22-03-2000-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-5368-3680-
crisitem.author.orcid0000-0003-1295-1594-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameBautista Delgado, Tomás-
crisitem.author.fullNameNúñez Ordóñez, Antonio-
Appears in Collections:Actas de congresos
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