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http://hdl.handle.net/10553/46921
| Título: | Influence of gate geometry in integrated MOS varactors on accumulation mode for RF | Autores/as: | Amselem, E. González, B. García, J. Aldea, I. Marrero Martín, Margarita Luisa Iturri, A. G. Del Pino, J. Khemchandani, S. L. Hernández Ballester, Antonio |
Clasificación UNESCO: | 3307 Tecnología electrónica | Palabras clave: | CMOS integrated circuits MOS integrated circuits radiofrequency integrated circuits Varactors |
Fecha de publicación: | 2007 | Publicación seriada: | 2007 Spanish Conference on Electron Devices, Proceedings | Conferencia: | 6th Spanish Conference on Electron Devices | Resumen: | Driven by the many applications that varactors have in RF integrated blocks, this work analyzes the influence of gate geometry (width and length) on integrated accumulation MOS varactors. For this purpose, a number of varactors have been designed and fabricated on a 0.8 mu m CMOS standard technology. The most relevant parameters: quality factor, tuning range, and capacitance, are simulated and compared against measurements. Some design considerations are reported. | URI: | http://hdl.handle.net/10553/46921 | ISBN: | 978-1-4244-0868-9 | DOI: | 10.1109/SCED.2007.383997 | Fuente: | 2007 Spanish Conference on Electron Devices, Proceedings (4271170), p. 68-71 |
| Colección: | Actas de congresos |
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