Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/44577
DC FieldValueLanguage
dc.contributor.authorPähler, Maikeen_US
dc.contributor.authorSantana, Juan Joséen_US
dc.contributor.authorSchuhmann, Wolfgangen_US
dc.contributor.authorSouto, Ricardo M.en_US
dc.contributor.otherSantana Rodriguez, Juan Jose-
dc.contributor.otherSchuhmann, Wolfgang-
dc.contributor.otherSouto, Ricardo M.-
dc.date.accessioned2018-11-22T00:44:59Z-
dc.date.available2018-11-22T00:44:59Z-
dc.date.issued2011en_US
dc.identifier.issn0947-6539en_US
dc.identifier.urihttps://accedacris.ulpgc.es/handle/10553/44577-
dc.description.abstractThe suitability of frequency‐dependent alternating‐current scanning electrochemical microscopy (4D AC‐SECM) for investigation of thin passivating layers covering the surface of corrosion‐inhibited metals has been demonstrated. Inhibition of copper corrosion by benzotriazole (BTAH) and methylbenzotriazole (MBTAH), which are effective inhibitors for this metal under many environmental conditions, was investigated. Strong dependencies were found for the AC z‐approach curves with both the duration of the inhibitor treatment and the frequency of the AC excitation signal applied in AC‐SECM. Both negative and positive feedback behaviours were observed in the AC approach curves for untreated copper and for Cu/BTAH and Cu/MBTAH samples. Negative feedback behaviour occurred in the low‐frequency range, whereas a positive feedback effect was observed at higher frequencies. A threshold frequency related to the passage from negative to positive regimes could be determined in each case. The threshold frequency for inhibitor‐modified samples was found always to be significantly higher than for the untreated metal, because the inhibitor film provides electrical insulation for the surface. Moreover, the threshold frequency increased with increasing surface coverage by the inhibitor. 4D AC‐SECM was successfully applied to visualizing spatially resolved differences in local electrochemical activity between inhibitor‐free and inhibitor‐covered areas of the sample.en_US
dc.languageengen_US
dc.publisher0947-6539-
dc.relation.ispartofChemistry - A European Journalen_US
dc.sourceChemistry - A European Journal[ISSN 0947-6539],v. 17, p. 905-911en_US
dc.subject3303 ingeniería y tecnología químicasen_US
dc.subject3306 Ingeniería y tecnología eléctricasen_US
dc.subject.otherCopperen_US
dc.subject.otherScanning probe microscopyen_US
dc.subject.otherCorrosion inhibitionen_US
dc.subject.otherElectrochemistryen_US
dc.subject.otherBenzotriazolesen_US
dc.titleApplication of AC-SECM in corrosion science: Local visualisation of inhibitor films on active metals for corrosion protectionen_US
dc.typeinfo:eu-repo/semantics/articlees
dc.typeArticlees
dc.identifier.doi10.1002/chem.201000689en_US
dc.identifier.scopus78651464896-
dc.identifier.isi000287259700023-
dcterms.isPartOfChemistry-A European Journal-
dcterms.sourceChemistry-A European Journal[ISSN 0947-6539],v. 17 (3), p. 905-911-
dc.contributor.authorscopusid57084101600-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid7005188945-
dc.contributor.authorscopusid7005304036-
dc.description.lastpage911-
dc.description.firstpage905-
dc.relation.volume17-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000287259700023-
dc.contributor.daisngid28226859-
dc.contributor.daisngid839683-
dc.contributor.daisngid12801-
dc.contributor.daisngid181058-
dc.identifier.investigatorRIDC-4040-2008-
dc.identifier.investigatorRIDS-2626-2016-
dc.identifier.investigatorRIDG-4004-2014-
dc.utils.revisionen_US
dc.identifier.ulpgces
dc.description.sjr2,726
dc.description.jcr5,925
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR Energía, Corrosión, Residuos y Agua-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameSantana Rodríguez, Juan José-
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