Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/44566
Campo DC | Valor | idioma |
---|---|---|
dc.contributor.author | Jose Santana, Juan | en_US |
dc.contributor.author | Pähler, Maike | en_US |
dc.contributor.author | Schuhmann, Wolfgang | en_US |
dc.contributor.author | Souto, Ricardo M. | en_US |
dc.contributor.other | Schuhmann, Wolfgang | - |
dc.contributor.other | Souto, Ricardo M. | - |
dc.contributor.other | Santana Rodriguez, Juan Jose | - |
dc.date.accessioned | 2018-11-22T00:39:39Z | - |
dc.date.available | 2018-11-22T00:39:39Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.issn | 2192-6506 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/44566 | - |
dc.description.abstract | Alternating current scanning electrochemical microscopy (AC-SECM) is used to investigate the inhibition of copper corrosion by four potential inhibitors, namely benzotriazole (BTAH), 5-methyl-benzotriazole (MBTAH), 2-mercaptobenzimidazole (MBI), and ethyl xanthate (EX). It is shown that the formation of inhibitor films on the metal can be followed from the decrease of the substrate's local electrochemical activity associated with the formation of inhibitor-containing surface layers. Sensitive imaging can be performed that accounts for changes in electrochemical activity of the modified surfaces, as well as for their corrosive attack from the environment. AC-SECM is shown to be a powerful technique for the investigation of corrosion processes. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | ChemPlusChem | en_US |
dc.source | Chempluschem[ISSN 2192-6506],v. 77 (8), p. 707-712 | en_US |
dc.subject | 3303 ingeniería y tecnología químicas | en_US |
dc.subject | 3306 Ingeniería y tecnología eléctricas | en_US |
dc.subject.other | Benzotriazoles | en_US |
dc.subject.other | Copper | en_US |
dc.subject.other | Corrosion inhibition | en_US |
dc.subject.other | Scanning probe microscopy | en_US |
dc.subject.other | surface chemistry | en_US |
dc.title | Investigation of copper corrosion inhibition with frequency-dependent alternating-current scanning electrochemical microscopy | en_US |
dc.type | info:eu-repo/semantics/Article | es |
dc.type | Article | es |
dc.identifier.doi | 10.1002/cplu.201200091 | |
dc.identifier.scopus | 84866122047 | - |
dc.identifier.isi | 000307401800013 | - |
dcterms.isPartOf | Chempluschem | - |
dcterms.source | Chempluschem[ISSN 2192-6506],v. 77 (8), p. 707-712 | - |
dc.contributor.authorscopusid | 35436067200 | - |
dc.contributor.authorscopusid | 57084101600 | - |
dc.contributor.authorscopusid | 7005188945 | - |
dc.contributor.authorscopusid | 7005304036 | - |
dc.description.lastpage | 712 | - |
dc.description.firstpage | 707 | - |
dc.relation.volume | 77 | - |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Artículo | en_US |
dc.identifier.wos | WOS:000307401800013 | - |
dc.contributor.daisngid | 839683 | - |
dc.contributor.daisngid | 28226859 | - |
dc.contributor.daisngid | 12801 | - |
dc.contributor.daisngid | 181058 | - |
dc.identifier.investigatorRID | S-2626-2016 | - |
dc.identifier.investigatorRID | G-4004-2014 | - |
dc.identifier.investigatorRID | C-4040-2008 | - |
dc.utils.revision | Sí | en_US |
dc.date.coverdate | Agosto 2012 | |
dc.identifier.ulpgc | Sí | es |
dc.description.scie | SCIE | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR Energía, Corrosión, Residuos y Agua | - |
crisitem.author.dept | Departamento de Ingeniería de Procesos | - |
crisitem.author.orcid | 0000-0002-3030-2195 | - |
crisitem.author.parentorg | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.fullName | Santana Rodríguez, Juan José | - |
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