Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/44563
Campo DC Valoridioma
dc.contributor.authorSantana, J. J.en_US
dc.contributor.authorSouto, R. M.en_US
dc.contributor.authorGonzález, S.en_US
dc.contributor.authorPähler, M.en_US
dc.contributor.authorSchuhmann, W.en_US
dc.contributor.otherSchuhmann, Wolfgang-
dc.contributor.otherSantana Rodriguez, Juan Jose-
dc.contributor.otherSouto, Ricardo M.-
dc.date.accessioned2018-11-22T00:38:09Z-
dc.date.available2018-11-22T00:38:09Z-
dc.date.issued2012en_US
dc.identifier.isbn978-16-07683-05-6en_US
dc.identifier.issn1938-5862en_US
dc.identifier.urihttp://hdl.handle.net/10553/44563-
dc.description.abstractAlternating-current scanning electrochemical microscopy (AC-SECM) is employed to characterize the early stages of the degradation reactions occurring in metal-coating systems upon exposure to an aqueous environment. The spatial resolution of the technique results from the measurement of changes in the resistance of the thin electrolyte layer comprised between the tip and the surface of the coating due to variations in the tip-substrate distance. Resistance measurements are conducted at various frequencies of the AC perturbation signal effectively allowing topographic changes to be monitored as a function of time. Furthermore, AC-SECM can be used to determine the tip-substrate distance without the addition of redox mediators to the electrolyte, which might affect the chemical properties of the system. In this way, the effect of chloride ions from the aqueous phase to induce either the heterogeneous absorption of water by the coating, or its accumulation at the metal-substrate interface, has been imaged.en_US
dc.languageengen_US
dc.publisher1938-5862en_US
dc.relation.ispartofECS Transactionsen_US
dc.sourceCoatings For Corrosion Protection[ISSN 1938-5862],v. 41 (15), p. 29-38en_US
dc.subject3303 ingeniería y tecnología químicasen_US
dc.subject3306 Ingeniería y tecnología eléctricasen_US
dc.subject.otherAlternating-current scanning electrochemical microscopyen_US
dc.titleInvestigation of early degradation processes at coated metals by AC-scanning electrochemical microscopyen_US
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.relation.conferenceSymposium on Coatings for Corrosion Protection Held During the 220th Meeting of the Electrochemical-Society (ECS)
dc.relation.conferenceCoatings for Corrosion Protection - 220th ECS Meeting
dc.identifier.doi10.1149/1.3696868
dc.identifier.scopus84879542943-
dc.identifier.isi000313673600003-
dcterms.isPartOfCoatings For Corrosion Protection-
dcterms.sourceCoatings For Corrosion Protection[ISSN 1938-5862],v. 41 (15), p. 29-38-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid7005304036-
dc.contributor.authorscopusid7202200085-
dc.contributor.authorscopusid57084101600-
dc.contributor.authorscopusid7005188945-
dc.description.lastpage38-
dc.description.firstpage29-
dc.relation.volume41-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000313673600003-
dc.contributor.daisngid778549
dc.contributor.daisngid839683-
dc.contributor.daisngid181058-
dc.contributor.daisngid351609-
dc.contributor.daisngid29952794
dc.contributor.daisngid28226859-
dc.contributor.daisngid12801-
dc.identifier.investigatorRIDS-2626-2016-
dc.identifier.investigatorRIDC-4040-2008-
dc.identifier.investigatorRIDG-4004-2014-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Santana, JJ
dc.contributor.wosstandardWOS:Souto, RM
dc.contributor.wosstandardWOS:Gonzalez, S
dc.contributor.wosstandardWOS:Pahler, M
dc.contributor.wosstandardWOS:Schuhmann, W
dc.date.coverdateDiciembre 2012
dc.identifier.conferenceidevents120813
dc.identifier.ulpgces
dc.description.sjr0,24
dc.description.sjrqQ3
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR Energía, Corrosión, Residuos y Agua-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.deptGIR IDeTIC: División de Procesado Digital de Señales-
crisitem.author.deptIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.orcid0000-0002-4621-2768-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.parentorgIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.fullNameSantana Rodríguez, Juan José-
crisitem.author.fullNameTravieso González, Carlos Manuel-
crisitem.event.eventsstartdate09-10-2011-
crisitem.event.eventsstartdate09-10-2011-
crisitem.event.eventsenddate14-10-2011-
crisitem.event.eventsenddate14-10-2011-
Colección:Actas de congresos
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