Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/44562
Campo DC Valoridioma
dc.contributor.authorSouto, R. M.en_US
dc.contributor.authorSantana, J. J.en_US
dc.contributor.authorMarques, A. G.en_US
dc.contributor.authorSimões, A. M.en_US
dc.contributor.otherSantana Rodriguez, Juan Jose-
dc.contributor.otherSouto, Ricardo M.-
dc.contributor.otherSimoes, Alda-
dc.date.accessioned2018-11-22T00:37:40Z-
dc.date.available2018-11-22T00:37:40Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-60768-324-7en_US
dc.identifier.issn1938-5862en_US
dc.identifier.urihttp://hdl.handle.net/10553/44562-
dc.description.abstractIn this work, the applicability of localized electrochemical impedance spectroscopy (LEIS) to characterize metal-corrosion inhibitor systems has been investigated. Copper corrosion inhibition by benzotriazole (BTA) and 2-mercaptobenzimidazole (MBI) has been studied, and compared to the electrochemical behaviour of the non inhibited metal. A rather wide frequency range of the AC potential signal was employed, namely 50 mHz ≤ f ≤ 65 kHz. The measurements were conducted for different probe-substrate distances in order to explore the effect of the different component of the localized impedance. Nyquist diagrams exhibit inductive loops in the high frequency range, and capacitive semicircles at intermediate and low frequencies for all the systems investigated, though they were affected in a different extent by the variation of the probe-substrate distance depending on the surface condition of the metal samples, this effect being more notorious for distances smaller than the dimensions of the bi-electrode probe.en_US
dc.languageengen_US
dc.publisher1938-5862en_US
dc.relation.ispartofECS Transactionsen_US
dc.sourceCritical Factors In Localized Corrosion 7[ISSN 1938-5862],v. 41 (25), p. 227-235en_US
dc.subject3303 ingeniería y tecnología químicasen_US
dc.subject.othermetal-corrosion inhibitor systemsen_US
dc.titleLocal electrochemical impedance spectroscopy investigation of corrosion inhibitor films on copperen_US
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.relation.conference7th Symposium on Critical Factors in Localized Corrosion held during the 220th Electrochemical-Society (ECS) Meeting
dc.relation.conference7th Symposium on Critical Factors in Localized Corrosion - 220th ECS Meeting
dc.identifier.doi10.1149/1.3697592
dc.identifier.scopus84879714877-
dc.identifier.isi000325392600020-
dcterms.isPartOfCritical Factors In Localized Corrosion 7-
dcterms.sourceCritical Factors In Localized Corrosion 7[ISSN 1938-5862],v. 41 (25), p. 227-235-
dc.contributor.authorscopusid7005304036-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid55781913200-
dc.contributor.authorscopusid7005778082-
dc.description.lastpage235-
dc.description.firstpage227-
dc.relation.volume41-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000325392600020-
dc.contributor.daisngid181058-
dc.contributor.daisngid839683-
dc.contributor.daisngid778549
dc.contributor.daisngid8042708-
dc.contributor.daisngid396300-
dc.identifier.investigatorRIDC-4040-2008-
dc.identifier.investigatorRIDG-4004-2014-
dc.identifier.investigatorRIDNo ID-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Souto, RM
dc.contributor.wosstandardWOS:Santana, JJ
dc.contributor.wosstandardWOS:Marques, AG
dc.contributor.wosstandardWOS:Simoes, AM
dc.date.coverdateDiciembre 2012
dc.identifier.conferenceidevents120843
dc.identifier.ulpgces
dc.description.sjr0,24
dc.description.sjrqQ3
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR Sistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameSantana Rodríguez, Juan José-
crisitem.event.eventsstartdate10-10-2011-
crisitem.event.eventsstartdate10-10-2011-
crisitem.event.eventsenddate13-10-2011-
crisitem.event.eventsenddate13-10-2011-
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