Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/44558
DC FieldValueLanguage
dc.contributor.authorIzquierdo, J.en_US
dc.contributor.authorNagy, L.en_US
dc.contributor.authorGonzález, S.en_US
dc.contributor.authorSantana, J. J.en_US
dc.contributor.authorNagy, G.en_US
dc.contributor.authorSouto, R. M.en_US
dc.contributor.otherSantana Rodriguez, Juan Jose-
dc.contributor.otherDept Gen & Phys Chem, Univ Pecs-
dc.contributor.otherSouto, Ricardo M.-
dc.contributor.otherIzquierdo Perez, Javier-
dc.date.accessioned2018-11-22T00:35:46Z-
dc.date.available2018-11-22T00:35:46Z-
dc.date.issued2013en_US
dc.identifier.issn1388-2481en_US
dc.identifier.urihttp://hdl.handle.net/10553/44558-
dc.description.abstractA new approach for studying the local distribution of anodic and cathodic sites in a corroding system using the scanning vibrating electrode technique (SVET) and scanning electrochemical microscopy (SECM) is presented. When zinc is coupled to iron, dissolution of the active metal occurs in a localized manner (e.g., pitting corrosion), allowing for cathodic sites to be developed on zinc. Local alkalization and oxygen consumption related to cathodic activity are detected above portions of the zinc surface using SECM. Anionic fluxes related to the generation of OH− ions could be measured on the zinc surface outside the corroding pit by rastering the SVET probe closer to the substrate.en_US
dc.languageengen_US
dc.publisher1388-2481-
dc.relation.ispartofElectrochemistry Communicationsen_US
dc.sourceElectrochemistry Communications[ISSN 1388-2481],v. 27, p. 50-53en_US
dc.subject3303 ingeniería y tecnología químicasen_US
dc.subject.otherSVETen_US
dc.subject.otherSECMen_US
dc.subject.otherGalvanic corrosiónen_US
dc.subject.otherConcentration distributionsen_US
dc.subject.otherZincen_US
dc.subject.otherIronen_US
dc.titleResolution of the apparent experimental discrepancies observed between SVET and SECM for the characterization of galvanic corrosion reactionsen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.1016/j.elecom.2012.11.002
dc.identifier.scopus84870312197-
dc.identifier.isi000316159200013-
dcterms.isPartOfElectrochemistry Communications-
dcterms.sourceElectrochemistry Communications[ISSN 1388-2481],v. 27, p. 50-53-
dc.contributor.authorscopusid35388543300-
dc.contributor.authorscopusid7201913476-
dc.contributor.authorscopusid7202200085-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid7201883321-
dc.contributor.authorscopusid7005304036-
dc.description.lastpage53-
dc.description.firstpage50-
dc.relation.volume27-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000316159200013-
dc.contributor.daisngid716020-
dc.contributor.daisngid31761002
dc.contributor.daisngid2652761-
dc.contributor.daisngid351609-
dc.contributor.daisngid29952794
dc.contributor.daisngid778549
dc.contributor.daisngid839683-
dc.contributor.daisngid27867999-
dc.contributor.daisngid181058-
dc.identifier.investigatorRIDC-4040-2008-
dc.identifier.investigatorRIDK-4631-2012-
dc.identifier.investigatorRIDG-4004-2014-
dc.identifier.investigatorRIDNo ID-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Izquierdo, J
dc.contributor.wosstandardWOS:Nagy, L
dc.contributor.wosstandardWOS:Gonzalez, S
dc.contributor.wosstandardWOS:Santana, JJ
dc.contributor.wosstandardWOS:Nagy, G
dc.contributor.wosstandardWOS:Souto, RM
dc.date.coverdateFebrero 2013
dc.identifier.ulpgces
dc.description.sjr1,811
dc.description.jcr4,287
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IDeTIC: División de Procesado Digital de Señales-
crisitem.author.deptIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.deptGIR Energía, Corrosión, Residuos y Agua-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0002-4621-2768-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.parentorgIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameTravieso González, Carlos Manuel-
crisitem.author.fullNameSantana Rodríguez, Juan José-
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