Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/44052
DC FieldValueLanguage
dc.contributor.authorVargas, J. F.en_US
dc.contributor.authorFerrer, M. A.en_US
dc.contributor.authorTravieso, C. M.en_US
dc.contributor.authorAlonso, J. B.en_US
dc.contributor.otherTravieso-Gonzalez, Carlos M.-
dc.contributor.otherFerrer, Miguel A-
dc.contributor.otherAlonso-Hernandez, Jesus B.-
dc.date.accessioned2018-11-21T19:52:05Z-
dc.date.available2018-11-21T19:52:05Z-
dc.date.issued2011en_US
dc.identifier.issn0031-3203en_US
dc.identifier.urihttp://hdl.handle.net/10553/44052-
dc.description.abstractA method for conducting off-line handwritten signature verification is described. It works at the global image level and measures the grey level variations in the image using statistical texture features. The co-occurrence matrix and local binary pattern are analysed and used as features. This method begins with a proposed background removal. A histogram is also processed to reduce the influence of different writing ink pens used by signers. Genuine samples and random forgeries have been used to train an SVM model and random and skilled forgeries have been used for testing it. Results are reasonable according to the state-of-the-art and approaches that use the same two databases: MCYT-75 and GPDS-100 Corpuses. The combination of the proposed features and those proposed by other authors, based on geometric information, also promises improvements in performance.en_US
dc.languagespaen_US
dc.publisher0031-3203-
dc.relation.ispartofPattern Recognitionen_US
dc.sourcePattern Recognition[ISSN 0031-3203],v. 44, p. 375-385en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherOff-line handwritten signature verification, Pattern recognition, Grey level information, Texture features, Co-occurrence matrix, Local binary pattern, LS-SVMen_US
dc.titleOff-line signature verification based on grey level information using texture featuresen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.1016/j.patcog.2010.07.028
dc.identifier.scopus77957988943-
dc.identifier.isi000284446200017-
dcterms.isPartOfPattern Recognition-
dcterms.sourcePattern Recognition[ISSN 0031-3203],v. 44 (2), p. 375-385-
dc.contributor.authorscopusid24767932500-
dc.contributor.authorscopusid55636321172
dc.contributor.authorscopusid55636321253-
dc.contributor.authorscopusid6602376272-
dc.contributor.authorscopusid24774957200-
dc.description.lastpage385-
dc.description.firstpage375-
dc.relation.volume44-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000284446200017-
dc.contributor.daisngid4558038-
dc.contributor.daisngid233119-
dc.contributor.daisngid265761-
dc.contributor.daisngid418703-
dc.identifier.investigatorRIDN-5967-2014-
dc.identifier.investigatorRIDL-3863-2013-
dc.identifier.investigatorRIDNo ID-
dc.identifier.externalWOS:000284446200017-
dc.contributor.wosstandardWOS:Vargas, JF
dc.contributor.wosstandardWOS:Ferrer, MA
dc.contributor.wosstandardWOS:Travieso, CM
dc.contributor.wosstandardWOS:Alonso, JB
dc.date.coverdateFebrero 2011
dc.identifier.ulpgces
dc.description.sjr1,346
dc.description.jcr2,292
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IDeTIC: División de Procesado Digital de Señales-
crisitem.author.deptIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.deptGIR IDeTIC: División de Procesado Digital de Señales-
crisitem.author.deptIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.deptGIR IDeTIC: División de Procesado Digital de Señales-
crisitem.author.deptIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.orcid0000-0002-2924-1225-
crisitem.author.orcid0000-0002-4621-2768-
crisitem.author.orcid0000-0002-7866-585X-
crisitem.author.parentorgIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.parentorgIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.parentorgIU para el Desarrollo Tecnológico y la Innovación-
crisitem.author.fullNameFerrer Ballester, Miguel Ángel-
crisitem.author.fullNameTravieso González, Carlos Manuel-
crisitem.author.fullNameAlonso Hernández, Jesús Bernardino-
Appears in Collections:Artículos
Show simple item record

SCOPUSTM   
Citations

185
checked on Dec 15, 2024

WEB OF SCIENCETM
Citations

146
checked on Dec 15, 2024

Page view(s)

51
checked on Jun 18, 2023

Google ScholarTM

Check

Altmetric


Share



Export metadata



Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.