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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42737
DC FieldValueLanguage
dc.contributor.authorAlbella Echave, Pabloen_US
dc.contributor.authorSaiz, J. M.en_US
dc.contributor.authorSanz, J. M.en_US
dc.contributor.authorGonzález, F.en_US
dc.contributor.authorMoreno, F.en_US
dc.date.accessioned2018-11-21T10:53:44Z-
dc.date.available2018-11-21T10:53:44Z-
dc.date.issued2009en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://hdl.handle.net/10553/42737-
dc.description.abstractWe present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.en_US
dc.languageengen_US
dc.relation.ispartofOptics Lettersen_US
dc.sourceOptics Letters [ISSN 0146-9592], v. 34, p. 1906-1908, (2009)en_US
dc.titleNanoscopic surface inspection by analyzing the linear polarization degree of the scattered lighten_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OL.34.001906en_US
dc.identifier.scopus67649353037-
dc.contributor.authorscopusid14032984700-
dc.contributor.authorscopusid7005152258-
dc.contributor.authorscopusid56516090900-
dc.contributor.authorscopusid56034341000-
dc.contributor.authorscopusid56251147800-
dc.description.lastpage1908en_US
dc.description.firstpage1906en_US
dc.relation.volume34en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionSíen_US
dc.identifier.ulpgcSíen_US
dc.description.jcr3,059-
dc.description.jcrqQ1-
dc.description.scieSCIE-
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.orcid0000-0001-7531-7828-
crisitem.author.fullNameAlbella Echave, Pablo-
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