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Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/42713
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dc.contributor.authorAlbella, Pablo
dc.contributor.authorPoyli, M. Ameen
dc.contributor.authorSchmidt, Mikolaj K.
dc.contributor.authorMaier, Stefan A.
dc.contributor.authorMoreno, Fernando
dc.contributor.authorSáenz, Juan José
dc.contributor.authorAizpurua, Javier
dc.date.accessioned2018-11-21T10:47:47Z-
dc.date.available2018-11-21T10:47:47Z-
dc.date.issued2013
dc.identifier.issn1932-7447
dc.identifier.urihttp://hdl.handle.net/10553/42713-
dc.publisher1932-7447
dc.relation.ispartofJournal of Physical Chemistry C
dc.sourceJournal of Physical Chemistry C[ISSN 1932-7447],v. 117, p. 13573-13584
dc.titleLow-loss electric and magnetic field-enhanced spectroscopy with subwavelength silicon dimers
dc.typeinfo:eu-repo/semantics/articlees
dc.typeArticlees
dc.identifier.doi10.1021/jp4027018
dc.identifier.scopus2-s2.0-84879820435-
dc.contributor.authorscopusid14032984700
dc.contributor.authorscopusid55274123300
dc.contributor.authorscopusid36992576200
dc.contributor.authorscopusid7201635833
dc.contributor.authorscopusid56251147800
dc.contributor.authorscopusid7006174524
dc.contributor.authorscopusid7003686501
dc.description.lastpage13584
dc.description.firstpage13573
dc.relation.volume117
dc.type2Artículoes
dc.identifier.ulpgcSíes
dc.description.sjr2,134
dc.description.jcr4,835
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.orcid0000-0001-7531-7828-
crisitem.author.fullNameAlbella Echave, Pablo-
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