Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/42713
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Albella, Pablo | |
dc.contributor.author | Poyli, M. Ameen | |
dc.contributor.author | Schmidt, Mikolaj K. | |
dc.contributor.author | Maier, Stefan A. | |
dc.contributor.author | Moreno, Fernando | |
dc.contributor.author | Sáenz, Juan José | |
dc.contributor.author | Aizpurua, Javier | |
dc.date.accessioned | 2018-11-21T10:47:47Z | - |
dc.date.available | 2018-11-21T10:47:47Z | - |
dc.date.issued | 2013 | |
dc.identifier.issn | 1932-7447 | |
dc.identifier.uri | http://hdl.handle.net/10553/42713 | - |
dc.publisher | 1932-7447 | |
dc.relation.ispartof | Journal of Physical Chemistry C | |
dc.source | Journal of Physical Chemistry C[ISSN 1932-7447],v. 117, p. 13573-13584 | |
dc.title | Low-loss electric and magnetic field-enhanced spectroscopy with subwavelength silicon dimers | |
dc.type | info:eu-repo/semantics/article | es |
dc.type | Article | es |
dc.identifier.doi | 10.1021/jp4027018 | |
dc.identifier.scopus | 2-s2.0-84879820435 | - |
dc.contributor.authorscopusid | 14032984700 | |
dc.contributor.authorscopusid | 55274123300 | |
dc.contributor.authorscopusid | 36992576200 | |
dc.contributor.authorscopusid | 7201635833 | |
dc.contributor.authorscopusid | 56251147800 | |
dc.contributor.authorscopusid | 7006174524 | |
dc.contributor.authorscopusid | 7003686501 | |
dc.description.lastpage | 13584 | |
dc.description.firstpage | 13573 | |
dc.relation.volume | 117 | |
dc.type2 | Artículo | es |
dc.identifier.ulpgc | Sí | es |
dc.description.sjr | 2,134 | |
dc.description.jcr | 4,835 | |
dc.description.sjrq | Q1 | |
dc.description.jcrq | Q1 | |
dc.description.scie | SCIE | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.orcid | 0000-0001-7531-7828 | - |
crisitem.author.fullName | Albella Echave, Pablo | - |
Appears in Collections: | Artículos |
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