Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/42703
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Freedman, Kevin J. | en_US |
dc.contributor.author | Crick, Colin R. | en_US |
dc.contributor.author | Albella, Pablo | en_US |
dc.contributor.author | Barik, Avijit | en_US |
dc.contributor.author | Ivanov, Aleksandar P. | en_US |
dc.contributor.author | Maier, Stefan A. | en_US |
dc.contributor.author | Oh, Sang Hyun | en_US |
dc.contributor.author | Edel, Joshua B. | en_US |
dc.date.accessioned | 2018-11-21T10:45:20Z | - |
dc.date.available | 2018-11-21T10:45:20Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.issn | 2330-4022 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/42703 | - |
dc.language | eng | en_US |
dc.relation.ispartof | ACS Photonics | en_US |
dc.source | ACS Photonics [ISSN 2330-4022], v. 3, p. 1036-1044 | en_US |
dc.title | On-Demand Surface-And Tip-Enhanced Raman Spectroscopy Using Dielectrophoretic Trapping and Nanopore Sensing | en_US |
dc.type | info:eu-repo/semantics/article | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1021/acsphotonics.6b00119 | en_US |
dc.identifier.scopus | 2-s2.0-84975090078 | - |
dc.contributor.authorscopusid | 35589895900 | - |
dc.contributor.authorscopusid | 26028240500 | - |
dc.contributor.authorscopusid | 14032984700 | - |
dc.contributor.authorscopusid | 56108510600 | - |
dc.contributor.authorscopusid | 36144012000 | - |
dc.contributor.authorscopusid | 7201635833 | - |
dc.contributor.authorscopusid | 55005509600 | - |
dc.contributor.authorscopusid | 7005079107 | - |
dc.description.lastpage | 1044 | en_US |
dc.description.firstpage | 1036 | en_US |
dc.relation.volume | 3 | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Artículo | en_US |
dc.utils.revision | Sí | en_US |
dc.identifier.ulpgc | No | en_US |
dc.contributor.buulpgc | BU-ING | en_US |
dc.description.sjr | 3,516 | |
dc.description.jcr | 6,756 | |
dc.description.sjrq | Q1 | |
dc.description.jcrq | Q1 | |
dc.description.scie | SCIE | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.orcid | 0000-0001-7531-7828 | - |
crisitem.author.fullName | Albella Echave, Pablo | - |
Appears in Collections: | Artículos |
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