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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42521
DC FieldValueLanguage
dc.contributor.authorKorotov S.en_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.authorAbad, Pilaren_US
dc.date.accessioned2018-11-19T17:10:47Z-
dc.date.available2018-11-19T17:10:47Z-
dc.date.issued2016en_US
dc.identifier.isbn978-3-319-32855-3-
dc.identifier.isbn978-3-319-32857-7-
dc.identifier.issn2194-1009en_US
dc.identifier.urihttp://hdl.handle.net/10553/42521-
dc.description.abstractThe longest-edge (LE-) trisection of the given tetrahedron is obtained by joining two equally spaced points on its longest edge with the opposite vertices, and, thus, splitting the tetrahedron into three sub-tetrahedra. On the base such LE-trisections we introduce and numerically test the refinement algorithms for tetrahedral meshes. Computations conducted show that the quality of meshes generated by these algorithms does not seem to degenerate.en_US
dc.languageengen_US
dc.relation.ispartofSpringer Proceedings in Mathematics and Statisticsen_US
dc.sourcePinelas S., Došlá Z., Došlý O., Kloeden P. (eds) Differential and Difference Equations with Applications. ICDDEA 2015. Springer Proceedings in Mathematics & Statistics, vol 164, p. 371-384. Springer, Chamen_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherLocal Refinement
dc.titleOn numerical regularity of trisection-based algorithms in 3Den_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjectes
dc.relation.conferenceInternational Conference on Differential and Difference Equations and Applications (ICDDEA)
dc.relation.conferenceInternational Conference on Differential and Difference Equations with Applications, ICDDEA 2015
dc.identifier.doi10.1007/978-3-319-32857-7_35
dc.identifier.scopus84988694035-
dc.identifier.isi000391876600035
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84988694035-
dc.contributor.authorscopusid6603451369-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.contributor.authorscopusid57196535626-
dc.identifier.eissn21941017-
dc.description.lastpage384-
dc.description.firstpage371-
dc.relation.volume164-
dc.investigacionCienciasen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid618611
dc.contributor.daisngid259483
dc.contributor.daisngid1080382
dc.contributor.daisngid1500747
dc.contributor.wosstandardWOS:Korotov, S
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Abad, P
dc.date.coverdateEnero 2016
dc.identifier.conferenceidevents121016
dc.identifier.ulpgcSíes
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate18-05-2015-
crisitem.event.eventsstartdate18-05-2015-
crisitem.event.eventsenddate22-05-2015-
crisitem.event.eventsenddate22-05-2015-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNameAbad Real, María Pilar-
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