Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42520
DC FieldValueLanguage
dc.contributor.authorPerdomo, Franciscoen_US
dc.contributor.authorPlaza, Angelen_US
dc.contributor.authorQuevedo E.en_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherQuevedo, Eduardo-
dc.contributor.otherSuarez, Jose Pablo-
dc.contributor.otherPLAZA, ANGEL-
dc.date.accessioned2018-11-19T17:08:56Z-
dc.date.available2018-11-19T17:08:56Z-
dc.date.issued2014en_US
dc.identifier.issn0378-4754en_US
dc.identifier.urihttp://hdl.handle.net/10553/42520-
dc.description.abstractThe Longest-Edge (LE) trisection of a triangle is obtained by joining the two points which divide the longest edge in three with the opposite vertex. If LE-trisection is iteratively applied to an initial triangle, then the maximum diameter of the resulting triangles is between two sharpened decreasing functions. This paper mathematically answers the question of how fast the diameters of a triangle mesh tend to zero as repeated trisection is performed, and completes the previous empirical studies presented in the MASCOT 2010 Meeting (Perdomo et al., 2010).en_US
dc.languageengen_US
dc.relation.ispartofMathematics and Computers in Simulationen_US
dc.sourceMathematics And Computers In Simulation [ISSN 0378-4754], v. 106, p. 95-108en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherLongest-edgeen_US
dc.subject.otherTriangle subdivisionen_US
dc.subject.otherTrisectionen_US
dc.subject.otherMesh refinementen_US
dc.subject.otherFinite element methoden_US
dc.titleA mathematical proof of how fast the diameters of a triangle mesh tend to zero after repeated trisectionen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matcom.2014.08.002en_US
dc.identifier.scopus84908671325-
dc.identifier.isi000345720800007-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84908671325-
dcterms.isPartOfMathematics And Computers In Simulation-
dcterms.sourceMathematics And Computers In Simulation[ISSN 0378-4754],v. 106, p. 95-108-
dc.contributor.authorscopusid55348970700-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid55845740700-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage108en_US
dc.description.firstpage95en_US
dc.relation.volume106en_US
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000345720800007-
local.message.claim2020-06-03T07:19:08.783+0100|||rp00596|||submit_approve|||dc_contributor_author|||None*
dc.contributor.daisngid2597710-
dc.contributor.daisngid259483-
dc.contributor.daisngid1780822-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDF-5552-2016-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.externalWOS:000345720800007-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Perdomo, F-
dc.contributor.wosstandardWOS:Plaza, A-
dc.contributor.wosstandardWOS:Quevedo, E-
dc.contributor.wosstandardWOS:Suarez, JP-
dc.date.coverdateEnero 2014en_US
dc.identifier.ulpgces
dc.description.sjr0,579
dc.description.jcr0,949
dc.description.sjrqQ1
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0002-5415-3446-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePerdomo Peña, Francisco-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameQuevedo Gutiérrez, Eduardo Gregorio-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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