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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42147
DC FieldValueLanguage
dc.contributor.authorEsper-Chaín Falcón, Robertoen_US
dc.contributor.authorEscuela, A.M.en_US
dc.contributor.authorSendra Sendra, José Ramónen_US
dc.contributor.authorFariña Santana, D.en_US
dc.date.accessioned2018-10-16T09:53:03Z-
dc.date.available2018-10-16T09:53:03Z-
dc.date.issued2019en_US
dc.identifier.issn0030-3992en_US
dc.identifier.urihttp://hdl.handle.net/10553/42147-
dc.description.abstractGaussian laser beam diameter can be estimated using quadrant photodiodes and x-y micropositioners. The resolution of the measurement reported depends on the resolution of the micropositioners. In this article, an improvement of the resolution using subsampling estimation is reported. This technique in combination with configurable quadrant photodiodes allow to avoid the use of micropositioners, easing the design of ultra-compact laser beam displacement measurement systems avoiding mechanical elements.en_US
dc.languageengen_US
dc.publisher0030-3992
dc.relation.ispartofOptics and Laser Technologyen_US
dc.sourceOptics and Laser Technology [ISSN 0030-3992], v. 109, p. 412-417en_US
dc.subject330790 Microelectrónicaen_US
dc.subject.otherGaussian beam measurementen_US
dc.subject.otherQuadrant photodiodeen_US
dc.subject.otherConfigurable quadrant photodiodeen_US
dc.titleSubsampling techniques for gaussian laser beam radius estimation using a configurable quadrant photodiode (CQD)en_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.optlastec.2018.07.080en_US
dc.identifier.scopus85051775354-
dc.identifier.isi000446949600052-
dc.contributor.authorscopusid57203461391-
dc.contributor.authorscopusid57203463169-
dc.contributor.authorscopusid6507060909-
dc.contributor.authorscopusid57188735317-
dc.description.lastpage417en_US
dc.description.firstpage412en_US
dc.relation.volume109en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid16593398-
dc.contributor.daisngid5534772-
dc.contributor.daisngid1648999-
dc.contributor.daisngid4535644-
dc.contributor.wosstandardWOS:Falcon, REC-
dc.contributor.wosstandardWOS:Escuela, AM-
dc.contributor.wosstandardWOS:Sendra, JR-
dc.contributor.wosstandardWOS:Santana, DF-
dc.date.coverdateEnero 2019en_US
dc.identifier.ulpgcSíes
dc.description.sjr0,792
dc.description.jcr3,233
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Equipos y Sistemas de Comunicación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Equipos y Sistemas de Comunicación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-8381-969X-
crisitem.author.orcid0000-0002-9634-7871-
crisitem.author.orcid0000-0001-5385-792X-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameEsper-Chaín Falcón, Roberto-
crisitem.author.fullNameMedina Escuela, Alfonso Francisco-
crisitem.author.fullNameSendra Sendra, José Ramón-
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