Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/41300
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Rodriguez, R. | - |
dc.contributor.author | Gonzalez, B. | - |
dc.contributor.author | Garcia, J. | - |
dc.contributor.author | Vega Martínez, Aurelio | - |
dc.contributor.author | Nunez, A. | - |
dc.date.accessioned | 2018-06-18T10:47:52Z | - |
dc.date.available | 2018-06-18T10:47:52Z | - |
dc.date.issued | 2017 | - |
dc.identifier.isbn | 9781509050727 | - |
dc.identifier.issn | 2163-4971 | - |
dc.identifier.other | WoS | - |
dc.identifier.uri | http://hdl.handle.net/10553/41300 | - |
dc.description.abstract | DC characteristics of AlGaN/GaN on Si MOS-HEMTs are measured and numerically simulated, with substrate temperature up to 140 degrees C, varying the gate width and gate length. Different gate recess depths are simulated in ATLAS in order to further investigate and optimize the device performance. Thermal boundary conditions and device thermal resistance are included in the structure for accurate simulation of the heating response. In addition, the relationship of the threshold voltage and saturation velocity with the substrate temperature and gate width has been studied and set in order to ease the modelling of these devices. | - |
dc.language | eng | - |
dc.relation.ispartof | Spanish Conference on Electron Devices | - |
dc.source | 2017 Spanish Conference on Electron Devices, CDE 2017 (7905214) | - |
dc.subject | 330790 Microelectrónica | - |
dc.subject.other | AlGaN/GaN | - |
dc.subject.other | MOS-HEMT | - |
dc.subject.other | Substrate temperature | - |
dc.title | DC characteristics with substrate temperature for GaN on Si MOS-HEMTs | - |
dc.type | info:eu-repo/semantics/conferenceObject | - |
dc.type | info:eu-repo/semantics/conferenceObject | - |
dc.type | ConferenceObject | - |
dc.relation.conference | 2017 Spanish Conference on Electron Devices, CDE 2017 | - |
dc.identifier.doi | 10.1109/CDE.2017.7905214 | - |
dc.identifier.scopus | 85019270381 | - |
dc.identifier.isi | 000403327900013 | - |
dc.contributor.authorscopusid | 7401544516 | - |
dc.contributor.authorscopusid | 56082155300 | - |
dc.contributor.authorscopusid | 8383160900 | - |
dc.contributor.authorscopusid | 57192805669 | - |
dc.contributor.authorscopusid | 56405149600 | - |
dc.contributor.authorscopusid | 7103279517 | - |
dc.investigacion | Ingeniería y Arquitectura | - |
dc.type2 | Actas de congresos | - |
dc.contributor.daisngid | 29724972 | - |
dc.contributor.daisngid | 1092737 | - |
dc.contributor.daisngid | 29725521 | - |
dc.contributor.daisngid | 31461801 | - |
dc.contributor.daisngid | 2351908 | - |
dc.description.numberofpages | 4 | - |
dc.identifier.eisbn | 978-1-5090-5072-7 | - |
dc.utils.revision | No | - |
dc.contributor.wosstandard | WOS:Rodriguez, R | - |
dc.contributor.wosstandard | WOS:Gonzalez, B | - |
dc.contributor.wosstandard | WOS:Garcia, J | - |
dc.contributor.wosstandard | WOS:Vega, A | - |
dc.contributor.wosstandard | WOS:Nunez, A | - |
dc.date.coverdate | Abril 2017 | - |
dc.identifier.conferenceid | events121045 | - |
dc.identifier.ulpgc | Sí | es |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Sistemas de Información y Comunicaciones | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Sistemas de Información y Comunicaciones | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Sistemas de Información y Comunicaciones | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0002-4457-8942 | - |
crisitem.author.orcid | 0000-0001-6864-9736 | - |
crisitem.author.orcid | 0000-0003-3561-0135 | - |
crisitem.author.orcid | 0000-0002-4154-8799 | - |
crisitem.author.orcid | 0000-0003-1295-1594 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Rodríguez Del Rosario, Raúl | - |
crisitem.author.fullName | González Pérez, Benito | - |
crisitem.author.fullName | García García, Javier Agustín | - |
crisitem.author.fullName | Vega Martínez, Aurelio | - |
crisitem.author.fullName | Núñez Ordóñez, Antonio | - |
crisitem.event.eventsstartdate | 08-02-2017 | - |
crisitem.event.eventsenddate | 10-02-2017 | - |
Appears in Collections: | Actas de congresos |
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