Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/130666
Title: A Wavelet-Based affie invariant contour description
Authors: Pérez, F
Falcón Martel, Antonio 
UNESCO Clasification: 3304 Tecnología de los ordenadores
Keywords: Wavelet
Proceso de imágenes
Issue Date: 1999
Publisher: Geneve
Conference: VIII National Symposium on Pattern Recognition and Image Analysis 
URI: http://hdl.handle.net/10553/130666
ISBN: 849512081X
Source: Pattern recognition and image analysis: proceedings of the VIII National Symposium on Pattern Tecognition and Image Analysis: Bilbao, Basque Country, Spain, 12-14 may 1999
Appears in Collections:Actas de congresos
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