Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/130666
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Pérez, F | en_US |
| dc.contributor.author | Falcón Martel, Antonio | en_US |
| dc.date.accessioned | 2024-05-27T09:10:43Z | - |
| dc.date.available | 2024-05-27T09:10:43Z | - |
| dc.date.issued | 1999 | en_US |
| dc.identifier.isbn | 849512081X | en_US |
| dc.identifier.uri | http://hdl.handle.net/10553/130666 | - |
| dc.language | eng | en_US |
| dc.publisher | Geneve | en_US |
| dc.source | Pattern recognition and image analysis: proceedings of the VIII National Symposium on Pattern Tecognition and Image Analysis: Bilbao, Basque Country, Spain, 12-14 may 1999 | en_US |
| dc.subject | 3304 Tecnología de los ordenadores | en_US |
| dc.subject.other | Wavelet | en_US |
| dc.subject.other | Proceso de imágenes | en_US |
| dc.title | A Wavelet-Based affie invariant contour description | en_US |
| dc.type | info:eu-repo/semantics/conferenceobject | en_US |
| dc.type | ConferenceObject | en_US |
| dc.relation.conference | VIII National Symposium on Pattern Recognition and Image Analysis | en_US |
| dc.investigacion | Ingeniería y Arquitectura | en_US |
| dc.type2 | Actas de congresos | en_US |
| dc.utils.revision | Sí | en_US |
| dc.identifier.ulpgc | Sí | en_US |
| dc.contributor.buulpgc | BU-INF | en_US |
| item.grantfulltext | none | - |
| item.fulltext | Sin texto completo | - |
| crisitem.author.dept | GIR SIANI: Inteligencia Artificial, Redes Neuronales, Aprendizaje Automático e Ingeniería de Datos | - |
| crisitem.author.dept | IU Sistemas Inteligentes y Aplicaciones Numéricas | - |
| crisitem.author.orcid | 0000-0002-7467-947X | - |
| crisitem.author.parentorg | IU Sistemas Inteligentes y Aplicaciones Numéricas | - |
| crisitem.author.fullName | Falcón Martel,Antonio | - |
| crisitem.event.eventsstartdate | 12-05-1999 | - |
| crisitem.event.eventsenddate | 14-05-1999 | - |
| Appears in Collections: | Actas de congresos | |
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