Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/128900
Title: Formal Verification of Fault-Tolerant Hardware Designs
Authors: Entrena, Luis
Sanchez-Clemente, Antonio J.
Garcia-Astudillo, Luis A.
Portela-Garcia, Marta
Garcia-Valderas, Mario
Lindoso, Almudena
Sarmiento, Roberto
Keywords: Circuit Faults
Equivalence Checking
Equivalent Circuits
Error Mitigation
Fault Tolerance, et al
Issue Date: 2023
Journal: IEEE Access
Abstract: Digital circuits for space applications can suffer from operation failures due to radiation effects. Error detection and mitigation techniques are widely accepted solutions to improve dependability of digital circuits under Single Event Upsets (SEUs) and Single Event Transients (SETs). These solutions imply design modifications that must be validated. This paper presents a formal verification method to prove that the applied fault tolerance techniques do actually prevent fault propagation as well as that the fault-tolerant circuit is functionally equivalent to the original version. The method has been implemented in an in-house software tool, VeriHard. It has been successfully applied to verify a wide variety of fault tolerance techniques, such as Triple Modular Redundancy (TMR), Duplication with Comparison (DwC), Safe Finite State Machines and Hamming encoding. Experimental results with benchmarks and industrial cases illustrates the capabilities of the method and its high performance.
URI: http://hdl.handle.net/10553/128900
ISSN: 2169-3536
DOI: 10.1109/ACCESS.2023.3325616
Source: IEEE Access[EISSN 2169-3536], (Enero 2023)
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