Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/128900
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dc.contributor.authorEntrena, Luisen_US
dc.contributor.authorSanchez-Clemente, Antonio J.en_US
dc.contributor.authorGarcia-Astudillo, Luis A.en_US
dc.contributor.authorPortela-Garcia, Martaen_US
dc.contributor.authorGarcia-Valderas, Marioen_US
dc.contributor.authorLindoso, Almudenaen_US
dc.contributor.authorSarmiento, Robertoen_US
dc.date.accessioned2024-02-14T12:40:20Z-
dc.date.available2024-02-14T12:40:20Z-
dc.date.issued2023en_US
dc.identifier.issn2169-3536en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/128900-
dc.description.abstractDigital circuits for space applications can suffer from operation failures due to radiation effects. Error detection and mitigation techniques are widely accepted solutions to improve dependability of digital circuits under Single Event Upsets (SEUs) and Single Event Transients (SETs). These solutions imply design modifications that must be validated. This paper presents a formal verification method to prove that the applied fault tolerance techniques do actually prevent fault propagation as well as that the fault-tolerant circuit is functionally equivalent to the original version. The method has been implemented in an in-house software tool, VeriHard. It has been successfully applied to verify a wide variety of fault tolerance techniques, such as Triple Modular Redundancy (TMR), Duplication with Comparison (DwC), Safe Finite State Machines and Hamming encoding. Experimental results with benchmarks and industrial cases illustrates the capabilities of the method and its high performance.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Accessen_US
dc.sourceIEEE Access[EISSN 2169-3536], (Enero 2023)en_US
dc.subject.otherCircuit Faultsen_US
dc.subject.otherEquivalence Checkingen_US
dc.subject.otherEquivalent Circuitsen_US
dc.subject.otherError Mitigationen_US
dc.subject.otherFault Toleranceen_US
dc.subject.otherFault Tolerant Systemsen_US
dc.subject.otherFlip-Flopsen_US
dc.subject.otherFormal Verificationen_US
dc.subject.otherFormal Verificationen_US
dc.subject.otherHardwareen_US
dc.subject.otherModel Checkingen_US
dc.subject.otherRedundancyen_US
dc.titleFormal Verification of Fault-Tolerant Hardware Designsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ACCESS.2023.3325616en_US
dc.identifier.scopus85174851699-
dc.identifier.isiWOS:001091028600001-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid6602921577-
dc.contributor.authorscopusid55485495600-
dc.contributor.authorscopusid57221258175-
dc.contributor.authorscopusid9639475200-
dc.contributor.authorscopusid9640262900-
dc.contributor.authorscopusid21834031600-
dc.contributor.authorscopusid35609452100-
dc.identifier.eissn2169-3536-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.date.coverdateEnero 2023en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr0,96
dc.description.jcr3,9
dc.description.sjrqQ1
dc.description.jcrqQ2
dc.description.scieSCIE
dc.description.miaricds10,4
item.grantfulltextopen-
item.fulltextCon texto completo-
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