Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/127458
DC FieldValueLanguage
dc.contributor.authorPadrón, Miguel A.en_US
dc.contributor.authorPlaza, Ángelen_US
dc.contributor.authorSuárez, Jose Pabloen_US
dc.date.accessioned2023-11-02T16:37:30Z-
dc.date.available2023-11-02T16:37:30Z-
dc.date.issued2023en_US
dc.identifier.issn2227-7390en_US
dc.identifier.otherScopus-
dc.description.abstractA tetrahedron is called regular if its six edges are of equal length. It is clear that, for an initial regular tetrahedron R0, the iterative eight-tetrahedron longest-edge partition (8T-LE) of R0 produces an infinity sequence of tetrahedral meshes, τ0 = {R0}, τ1 = {R1}, τ2 = {R2}, . . ., τn = {Rn }, . . .. In this paper, it is proven that, in the iterative process just mentioned, only two distinct similarity classes are generated. Therefore, the stability and the non-degeneracy of the generated meshes, as well as the minimum and maximum angle condition straightforwardly follow. Additionally, for a standard-shape tetrahedron quality measure (η) and any tetrahedron Rn Є τn, n > 0, then η Rn ≥ 2/3 η(R0). The non-degeneracy constant is c = 2/3 in the case of the iterative 8T-LE partition of a regular tetrahedron.en_US
dc.languageengen_US
dc.relationFEI Innovación y Transferencia empresarial en material científico tecnológica en la rama Geoinformática y datosen_US
dc.relation.ispartofMathematicsen_US
dc.sourceMathematics [ISSN 2227-7390], v. 11, 4456, (Octubre 2023)en_US
dc.subject12 Matemáticasen_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherRegular tetrahedronen_US
dc.subject.otherSimilarity classesen_US
dc.subject.other8T-LE partitionen_US
dc.subject.otherNormalized sextupleen_US
dc.subject.otherLongest-edge bisectionen_US
dc.subject.otherStrong stabilityen_US
dc.subject.otherRefinementen_US
dc.subject.otherMeshesen_US
dc.titleSimilarity classes in the eight-tetrahedron longest-edge partition of a regular tetrahedronen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/math11214456en_US
dc.identifier.scopus85176548365-
dc.contributor.orcid0000-0001-5493-3090-
dc.contributor.orcid0000-0002-5077-6531-
dc.contributor.orcid0000-0001-8140-9008-
dc.contributor.authorscopusid6603825227-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid7202040282-
dc.identifier.eissn2227-7390-
dc.identifier.issue21-
dc.relation.volume11en_US
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.description.numberofpages13en_US
dc.utils.revisionen_US
dc.date.coverdateOctober 2023en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INFen_US
dc.description.sjr0,475-
dc.description.jcr2,3-
dc.description.sjrqQ2-
dc.description.jcrqQ1-
dc.description.scieSCIE-
dc.description.miaricds10,4-
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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