Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/124266
Campo DC Valoridioma
dc.contributor.authorCabrera-Peña, Joseen_US
dc.contributor.authorBrito-Garcia, Santiago Joseen_US
dc.contributor.authorMi̊rza-Roşca, Julia Claudiaen_US
dc.contributor.authorCallicó, Gustavo M.en_US
dc.date.accessioned2023-09-04T11:48:49Z-
dc.date.available2023-09-04T11:48:49Z-
dc.date.issued2023en_US
dc.identifier.issn2075-4701en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/124266-
dc.description.abstractDue to the optimistic outcomes of the research on high-entropy alloys, new designs of these alloys are being encouraged. We studied the high-entropy CoCrFeMoNi alloy and the CoCrFeMoNi alloy doped with Zr. In order to choose the best electrical equivalent circuit for the prediction of the behavior of these high-entropy alloys at various potentials in artificial seawater, electrochemical impedance spectroscopy (EIS) measurements were conducted on samples with and without Zr-doped CoCrFeMoNi. At various potential levels, the impedance spectra were measured between −1.0 and +0.8 V vs. SCE. The study consists of a preliminary section with microstructure by metallography, open-circuit potential, and linear polarization curves by direct-current tests followed by visual analysis of the impedance spectra, and, finally, the selection of an equivalent electrical circuit model to fit the experimental data. By leveraging the advantages of EIS analysis, the information is essential for materials development, corrosion-mitigation strategies, and the successful implementation of these alloys in practical applications. It is important to note that selecting an equivalent circuit is often an iterative and subjective process, as it involves a balance between model complexity and the ability to accurately represent the system’s behavior.en_US
dc.languageengen_US
dc.relation.ispartofMetalsen_US
dc.sourceMetals[EISSN 2075-4701],v. 13 (7), (Julio 2023)en_US
dc.subject330790 Microelectrónicaen_US
dc.subject.otherEisen_US
dc.subject.otherEquivalent Circuiten_US
dc.subject.otherHigh-Entropy Alloysen_US
dc.subject.otherZr-Dopeden_US
dc.titleElectrical Equivalent Circuit Model Prediction of High-Entropy Alloy Behavior in Aggressive Mediaen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/met13071204en_US
dc.identifier.scopus85166249335-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcid0000-0003-0623-3318-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid58513284000-
dc.contributor.authorscopusid58138390300-
dc.contributor.authorscopusid6602582214-
dc.contributor.authorscopusid56006321500-
dc.identifier.eissn2075-4701-
dc.identifier.issue7-
dc.relation.volume13en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.date.coverdateJulio 2023en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr0,554
dc.description.jcr2,9
dc.description.sjrqQ1
dc.description.jcrqQ2
dc.description.scieSCIE
dc.description.miaricds10,5
item.grantfulltextrestricted-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR Nanomaterials and Corrosion-
crisitem.author.deptGIR Nanomaterials and Corrosion-
crisitem.author.deptDepartamento de Ingeniería Mecánica-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0001-6557-2294-
crisitem.author.orcid0000-0002-3976-2411-
crisitem.author.orcid0000-0003-0623-3318-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgDepartamento de Ingeniería Mecánica-
crisitem.author.parentorgDepartamento de Ingeniería Mecánica-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameCabrera Peña, José María-
crisitem.author.fullNameBrito Garcia,Santiago Jose-
crisitem.author.fullNameMirza Rosca, Julia Claudia-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
Colección:Artículos
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