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http://hdl.handle.net/10553/123071
Title: | Capacitance Characterization of Coupled Transmission Lines Applied to VLSI Interconnections Modelling |
Authors: | Aghzout, Otman Gómez Déniz, Luis Canino Rodríguez, José Miguel Medina Mena, Francisco |
UNESCO Clasification: | 330790 Microelectrónica |
Issue Date: | 2000 |
Publisher: | Universidad de Las Palmas de Gran Canaria (ULPGC) |
Conference: | International Conference on Modelling and Simulation (MS'2000) |
Abstract: | The calculation of the electrical parameters of tr2uismission linea inside CMOS integrated circuits is presented. It is shown that a commonly used 2-D device simulator, MEDICI, can be employed to compute the electrical péiTEtmeters. In pEurticular, decreóising size dimensions in interconnections mótkes parasitic coupling capsicitcince more hnportant. In this work we propose a set of design rules to reduce the coupling problem in the future developments in VLSI interconnection and their impact on peak crosstalk in 0.18 /xm. In order to estímate crosstalk noise in the signal lines, SPICE simulations have been used. |
URI: | http://hdl.handle.net/10553/123071 |
ISBN: | 84-95286-59-9 |
Source: | Proceedings of MS'2000 international conference on modelling and simulation / Ed. Rosario Berriel Martínez, p. 471-478 |
Appears in Collections: | Conference proceedings |
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