Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/122969
Campo DC Valoridioma
dc.contributor.authorWu, Jieen_US
dc.contributor.authorGómez Déniz, Luisen_US
dc.contributor.authorFrery, Alejandro C.en_US
dc.date.accessioned2023-05-23T07:22:28Z-
dc.date.available2023-05-23T07:22:28Z-
dc.date.issued2022en_US
dc.identifier.isbn978-1-6654-2792-0en_US
dc.identifier.issn2153-6996en_US
dc.identifier.urihttp://hdl.handle.net/10553/122969-
dc.description.abstractSAR imagery is always accompanied by speckle because it is obtained with coherent illumination. Given the multiplica-tive property of speckle, ratio-based metrics are widely used in SAR image quality assessment. In this paper, using the hy-potheses testing principle, a likelihood ratio test (LRT) based metric was designed for similarity measure in intensity SAR imagery. Then, using non-local means (NLM) scheme, an LRT-based NLM filter was proposed for speckle reduction of SAR imagery. In the experiments, using simulated intensity speckled images, the performance of the designed method is analyzed.en_US
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofIEEE International Geoscience and Remote Sensing Symposium proceedingsen_US
dc.sourceIGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium, Kuala Lumpur, Malaysia, 2022, p. 2319-2322en_US
dc.subject220990 Tratamiento digital. Imágenesen_US
dc.subject.otherLikelihood ratio testen_US
dc.subject.otherMultiplicative modelen_US
dc.subject.otherNon-local meanen_US
dc.subject.otherSARen_US
dc.subject.otherSpeckle reductionen_US
dc.titleA Non-Local Means Filters for Sar Speckle Reduction with Likelihood Ratio Testen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConference proceedingsen_US
dc.relation.conferenceIEEE International Symposium on Geoscience and Remote Sensing (IGARSS 2022)en_US
dc.identifier.doi10.1109/IGARSS46834.2022.9883822en_US
dc.identifier.scopus2-s2.0-85140396922-
dc.identifier.isiWOS:000920916602134-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.description.lastpage2322en_US
dc.description.firstpage2319en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.description.notasSar Speckle Reductionen_US
dc.identifier.eisbn978-1-6654-2791-3-
dc.utils.revisionen_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.ggs3
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate17-07-2022-
crisitem.event.eventsenddate22-07-2022-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
crisitem.author.fullNameC. Frery, Alejandro-
Colección:Actas de congresos
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