Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/122969
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wu, Jie | en_US |
dc.contributor.author | Gómez Déniz, Luis | en_US |
dc.contributor.author | Frery, Alejandro C. | en_US |
dc.date.accessioned | 2023-05-23T07:22:28Z | - |
dc.date.available | 2023-05-23T07:22:28Z | - |
dc.date.issued | 2022 | en_US |
dc.identifier.isbn | 978-1-6654-2792-0 | en_US |
dc.identifier.issn | 2153-6996 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/122969 | - |
dc.description.abstract | SAR imagery is always accompanied by speckle because it is obtained with coherent illumination. Given the multiplica-tive property of speckle, ratio-based metrics are widely used in SAR image quality assessment. In this paper, using the hy-potheses testing principle, a likelihood ratio test (LRT) based metric was designed for similarity measure in intensity SAR imagery. Then, using non-local means (NLM) scheme, an LRT-based NLM filter was proposed for speckle reduction of SAR imagery. In the experiments, using simulated intensity speckled images, the performance of the designed method is analyzed. | en_US |
dc.language | eng | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.ispartof | IEEE International Geoscience and Remote Sensing Symposium proceedings | en_US |
dc.source | IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium, Kuala Lumpur, Malaysia, 2022, p. 2319-2322 | en_US |
dc.subject | 220990 Tratamiento digital. Imágenes | en_US |
dc.subject.other | Likelihood ratio test | en_US |
dc.subject.other | Multiplicative model | en_US |
dc.subject.other | Non-local mean | en_US |
dc.subject.other | SAR | en_US |
dc.subject.other | Speckle reduction | en_US |
dc.title | A Non-Local Means Filters for Sar Speckle Reduction with Likelihood Ratio Test | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | en_US |
dc.type | Conference proceedings | en_US |
dc.relation.conference | IEEE International Symposium on Geoscience and Remote Sensing (IGARSS 2022) | en_US |
dc.identifier.doi | 10.1109/IGARSS46834.2022.9883822 | en_US |
dc.identifier.scopus | 2-s2.0-85140396922 | - |
dc.identifier.isi | WOS:000920916602134 | - |
dc.contributor.orcid | #NODATA# | - |
dc.contributor.orcid | #NODATA# | - |
dc.contributor.orcid | #NODATA# | - |
dc.description.lastpage | 2322 | en_US |
dc.description.firstpage | 2319 | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.description.notas | Sar Speckle Reduction | en_US |
dc.identifier.eisbn | 978-1-6654-2791-3 | - |
dc.utils.revision | Sí | en_US |
dc.identifier.ulpgc | Sí | en_US |
dc.contributor.buulpgc | BU-TEL | en_US |
dc.description.ggs | 3 | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.event.eventsstartdate | 17-07-2022 | - |
crisitem.event.eventsenddate | 22-07-2022 | - |
crisitem.author.dept | GIR IUCES: Centro de Tecnologías de la Imagen | - |
crisitem.author.dept | IU de Cibernética, Empresa y Sociedad (IUCES) | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-0667-2302 | - |
crisitem.author.orcid | 0000-0002-8002-5341 | - |
crisitem.author.parentorg | IU de Cibernética, Empresa y Sociedad (IUCES) | - |
crisitem.author.fullName | Gómez Déniz, Luis | - |
crisitem.author.fullName | C. Frery, Alejandro | - |
Appears in Collections: | Actas de congresos |
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