Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/121984
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Quintana Quintana, Laura | en_US |
dc.contributor.author | Ortega, Samuel | en_US |
dc.contributor.author | Fabelo, Himar | en_US |
dc.contributor.author | Balea Fernandez, Francisco Javier | en_US |
dc.contributor.author | Callicó, Gustavo M. | en_US |
dc.date.accessioned | 2023-04-24T07:25:22Z | - |
dc.date.available | 2023-04-24T07:25:22Z | - |
dc.date.issued | 2023 | en_US |
dc.identifier.other | Scopus | - |
dc.identifier.uri | http://hdl.handle.net/10553/121984 | - |
dc.description.abstract | Hyperspectral (HS) imaging (HSI) expands the number of channels captured within the electromagnetic spectrum with respect to regular imaging. Thus, microscopic HSI can improve cancer diagnosis by automatic classification of cells. However, homogeneous focus is difficult to achieve in such images, being the aim of this work to automatically quantify their focus for further image correction. A HS image database for focus assessment was captured. Subjective scores of image focus were obtained from 24 subjects and then correlated to state-of-the-art methods. Maximum Local Variation, Fast Image Sharpness block-based Method and Local Phase Coherence algorithms provided the best correlation results. With respect to execution time, LPC was the fastest. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Optics Express | en_US |
dc.source | Optics Express[EISSN 1094-4087],v. 31 (8), p. 12261-12279, (Abril 2023) | en_US |
dc.subject | 3314 Tecnología médica | en_US |
dc.title | Blur-specific image quality assessment of microscopic hyperspectral images | en_US |
dc.type | info:eu-repo/semantics/Article | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1364/OE.476949 | en_US |
dc.identifier.scopus | 85152474273 | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.authorscopusid | 58183363200 | - |
dc.contributor.authorscopusid | 57189334144 | - |
dc.contributor.authorscopusid | 56405568500 | - |
dc.contributor.authorscopusid | 57221266705 | - |
dc.contributor.authorscopusid | 56006321500 | - |
dc.identifier.eissn | 1094-4087 | - |
dc.description.lastpage | 12279 | en_US |
dc.identifier.issue | 8 | - |
dc.description.firstpage | 12261 | en_US |
dc.relation.volume | 31 | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Artículo | en_US |
dc.utils.revision | Sí | en_US |
dc.date.coverdate | Abril 2023 | en_US |
dc.identifier.ulpgc | Sí | en_US |
dc.contributor.buulpgc | BU-TEL | en_US |
dc.description.sjr | 0,998 | |
dc.description.jcr | 3,833 | |
dc.description.sjrq | Q1 | |
dc.description.jcrq | Q2 | |
dc.description.scie | SCIE | |
dc.description.miaricds | 10,9 | |
item.grantfulltext | open | - |
item.fulltext | Con texto completo | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Psicología, Sociología y Trabajo Social | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-1154-6490 | - |
crisitem.author.orcid | 0000-0002-7519-954X | - |
crisitem.author.orcid | 0000-0002-9794-490X | - |
crisitem.author.orcid | 0000-0003-2028-0858 | - |
crisitem.author.orcid | 0000-0002-3784-5504 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Quintana Quintana, Laura | - |
crisitem.author.fullName | Ortega Sarmiento,Samuel | - |
crisitem.author.fullName | Fabelo Gómez, Himar Antonio | - |
crisitem.author.fullName | Balea Fernandez, Francisco Javier | - |
crisitem.author.fullName | Marrero Callicó, Gustavo Iván | - |
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