Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/121749
Title: Partial TMR in FPGAs Using Approximate Logic Circuits
Authors: Sánchez Clemente, Antonio José 
Entrena, L.
Garcia-Valderas, M.
UNESCO Clasification: 330790 Microelectrónica
Keywords: Approximate circuit | FPGA | selective mitigation | single event upset | triple modular redundancy
Issue Date: 2016
Journal: IEEE Transactions on Nuclear Science
Conference: European Conference on Radiation and its Effects on Components and Systems, RADECS 2015
Abstract: TMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive in terms of FPGA resource utilization and power consumption. For certain applications, Partial TMR can be used to trade off the reliability with the cost of mitigation. In this work we propose a new approach to build Partial TMR circuits for FPGAs using approximate logic circuits. This approach is scalable, with a fine granularity, and can provide a flexible balance between reliability and overheads. The proposed approach has been validated by the results of fault injection experiments and proton irradiation campaigns.
URI: http://hdl.handle.net/10553/121749
ISBN: 9781509002313
ISSN: 0018-9499
DOI: 10.1109/TNS.2016.2541700
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