Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/114886
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dc.contributor.authorSantana Rodríguez, Juan Joséen_US
dc.contributor.authorIzquierdo, Javieren_US
dc.contributor.authorSouto, Ricardo M.en_US
dc.date.accessioned2022-05-31T07:57:01Z-
dc.date.available2022-05-31T07:57:01Z-
dc.date.issued2022en_US
dc.identifier.issn2079-6412en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/114886-
dc.description.abstractScanning Electrochemical Microscopy (SECM) is increasingly used in the study and characterization of thin surface films as well as organic and inorganic coatings applied on metals for the collection of spatially-and chemically-resolved information on the localized reactions related to material degradation processes. The movement of a microelectrode (ME) in close proximity to the interface under study allows the application of various experimental procedures that can be classified into amperometric and potentiometric operations depending on either sensing faradaic currents or concentration distributions resulting from the corrosion process. Quantitative analysis can be performed using the ME signal, thus revealing different sample properties and/or the influence of the environment and experimental variables that can be observed on different length scales. In this way, identification of the earlier stages for localized corrosion initiation, the adsorption and formation of inhibitor layers, monitoring of water and specific ions uptake by intact polymeric coatings applied on metals for corrosion protection as well as lixiviation, and detection of coating swelling—which constitutes the earlier stages of blistering—have been successfully achieved. Unfortunately, despite these successful applications of SECM for the characterization of surface layers and coating systems applied on metallic materials, we often find in the scientific literature insufficient or even inadequate description of experimental conditions related to the reliability and reproducibility of SECM data for validation. This review focuses specifically on these features as a continuation of a previous review describing the applications of SECM in this field.en_US
dc.languageengen_US
dc.relation.ispartofCoatingsen_US
dc.sourceCoatings [EISSN 2079-6412], v. 12 (5), 637, (Mayo 2022)en_US
dc.subject331005 Ingeniería de procesosen_US
dc.subject.otherCoating Degradationen_US
dc.subject.otherCorrosion Inhibitor Filmsen_US
dc.subject.otherCorrosion Protectionen_US
dc.subject.otherElectrochemical Activityen_US
dc.subject.otherMicroelectrodeen_US
dc.subject.otherScanning Electrochemical Microscopyen_US
dc.titleUses of Scanning Electrochemical Microscopy (SECM) for the Characterization with Spatial and Chemical Resolution of Thin Surface Layers and Coating Systems Applied on Metals: A Reviewen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/coatings12050637en_US
dc.identifier.scopus85130179285-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid35388543300-
dc.contributor.authorscopusid7005304036-
dc.identifier.eissn2079-6412-
dc.identifier.issue5-
dc.relation.volume12en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.date.coverdateMayo 2022en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INGen_US
dc.description.sjr0,513
dc.description.jcr3,4
dc.description.sjrqQ2
dc.description.jcrqQ2
dc.description.scieSCIE
dc.description.miaricds10,5
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR Energía, Corrosión, Residuos y Agua-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameSantana Rodríguez, Juan José-
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