Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/113934
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dc.contributor.authorLeón, Raquelen_US
dc.contributor.authorFabelo, Himaren_US
dc.contributor.authorOrtega Sarmiento, Samuelen_US
dc.contributor.authorCallicó, Gustavo M.en_US
dc.date.accessioned2022-03-03T10:13:17Z-
dc.date.available2022-03-03T10:13:17Z-
dc.date.issued2021en_US
dc.identifier.isbn978-1-6654-2116-4en_US
dc.identifier.issn2640-5563en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/113934-
dc.description.abstractHyperspectral (HS) imaging (HSI) is arising as a novel imaging technique to delineate brain tumor tissue in surgical-Time. The accurate identification of the boundaries between tumor and normal tissue determines prolonged survival. In this work, a preliminary spectral analysis of different brain tissue was performed to identify features between different classes. A HSI dataset of in-vivo brain tissue was acquired by two HS cameras, covering the VNIR (Visual and Near-Infrared) [400-1000 nm] and NIR (Near-Infrared) [900-1700 nm] spectral ranges. Both HS images were registered using feature-based techniques with different geometric transformations to perform a spectral analysis of a certain pixel. Reflectance and absorbance spectral signatures were analyzed identifying spectral absorbance peaks related with hemoglobin and water. Finally, a statistical analysis was performed, where normal tissue (NT), tumor tissue (TT), and hypervascularized tissue (HT) were compared, obtaining highly statistically significance between HT-NT and HT-TT in both VNIR and NIR spectral ranges analyzed, and some no statistically significant differences between TT and NT in certain spectral ranges.en_US
dc.languageengen_US
dc.relationWatching the risk factors: Artificial intelligence and the prevention of chronic conditionsen_US
dc.relationTalent Imágenes Hiperespectrales Para Aplicaciones de Inteligencia Artificialen_US
dc.relation.ispartofProceedings (Conference on Design of Circuits and Integrated Systems)en_US
dc.source36th Conference on Design of Circuits and Integrated Systems, DCIS 2021[EISSN 2640-5563], (Enero 2021)en_US
dc.subject3314 Tecnología médicaen_US
dc.subject.otherBrain Tumorsen_US
dc.subject.otherHyperspectral Imagingen_US
dc.subject.otherImage Registrationen_US
dc.subject.otherStatistical Analysisen_US
dc.titleHyperspectral VNIR and NIR Sensors for the Analysis of Human Normal Brain and Tumor Tissueen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference36th Conference on Design of Circuits and Integrated Systems - DCIS 2021en_US
dc.identifier.doi10.1109/DCIS53048.2021.9666168en_US
dc.identifier.scopus85124970807-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid57212456639-
dc.contributor.authorscopusid56405568500-
dc.contributor.authorscopusid57189334144-
dc.contributor.authorscopusid56006321500-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateEnero 2021en_US
dc.identifier.conferenceidevents130120-
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-4287-3200-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameLeón Martín,Sonia Raquel-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameOrtega Sarmiento,Samuel-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
crisitem.project.fundingProgramConcedido-
crisitem.project.principalinvestigatorMarrero Callicó, Gustavo Iván-
crisitem.project.principalinvestigatorMarrero Callicó, Gustavo Iván-
Appears in Collections:Actas de congresos
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