Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/112163
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dc.contributor.authorGomez-Deniz, L.en_US
dc.contributor.authorFrery, A. C.en_US
dc.date.accessioned2021-10-06T16:43:52Z-
dc.date.available2021-10-06T16:43:52Z-
dc.date.issued2019en_US
dc.identifier.isbn978-1-5386-9154-0en_US
dc.identifier.issn2153-6996en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/112163-
dc.description.abstractThe NLM (Nonlocal Means) approach is an effective framework for noise reduction. It relies on building, for each pixel, a convolution matrix whose entries are measures of similarities between patches. Such measures have to be computed between positive-definite Hermitian matrices when it comes to Polarimetric Synthetic Aperture Radar (PolSAR) imagery. Speckle reduction in this kind of images is a difficult task, as it is expected that several properties are well preserved by the filter. Torres et al. (2014) used a test statistic between Wishart distributions based on the Hellinger distance to compute such measures of similarity. In this work we assess the impact of using this and two other stochastic distances (Kullback-Leibler and Bhattacharya) under the same framework. The comparison is made using mean preservation, equivalent number of looks, edge correlation and the structural similarity index.en_US
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofIEEE International Geoscience and Remote Sensing Symposium proceedingsen_US
dc.sourceInternational Geoscience and Remote Sensing Symposium (IGARSS)[EISSN 2153-6996], v. 2019-January, p. 5109-5112, (Enero 2019)en_US
dc.subject220920 Radiometríaen_US
dc.subject.otherNon-Local Meansen_US
dc.subject.otherPolSARen_US
dc.subject.otherSDNLMen_US
dc.subject.otherSpeckleen_US
dc.subject.otherStochastic Distancesen_US
dc.titleThe influence of distances in NLM Polsar filtersen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference39th IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2019)en_US
dc.identifier.doi10.1109/IGARSS.2019.8900394en_US
dc.identifier.scopus85113899943-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid57238480700-
dc.contributor.authorscopusid7003561251-
dc.description.lastpage5112en_US
dc.description.firstpage5109en_US
dc.relation.volume2019-Januaryen_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.eisbn978-1-5386-9153-3-
dc.identifier.eisbn978-1-5386-9155-7-
dc.utils.revisionen_US
dc.date.coverdateEnero 2019en_US
dc.identifier.conferenceidevents120089-
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
crisitem.author.fullNameC. Frery, Alejandro-
Colección:Actas de congresos
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