Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/111481
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dc.contributor.authorQuintana Quintana, Lauraen_US
dc.contributor.authorOrtega Sarmiento, Samuelen_US
dc.contributor.authorFabelo, Himaren_US
dc.contributor.authorCallicó, Gustavo M.en_US
dc.date.accessioned2021-08-31T08:49:59Z-
dc.date.available2021-08-31T08:49:59Z-
dc.date.issued2021en_US
dc.identifier.isbn978-1-6654-3601-4en_US
dc.identifier.issn2158-6276en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/111481-
dc.description.abstractHyperspectral (HS) imaging is a novel technique that allows for better understanding of materials, being an improvement in multiple applications. However, one of its main drawbacks is the focus assessment. This issue has already been covered for RGB images. Thus, in this study, it is going to be revised several no reference RGB image quality assessment algorithms (NR-IQA). To this aim, a HS image database was created by capturing different images of the same specimen at different working distances. NR-IQA algorithms were tested over monochromatic images extracted from the HS images. Additionally, a study through each independent wavelength was carried out. Results showed that some algorithms perform better for calibration samples and another ones for biological samples. Furthermore, focus differences were found in the initial and final wavelengths. In conclusion, HS image results are similar to the one obtained for RGB images but, there is still room for improvement.en_US
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofWorkshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensingen_US
dc.sourceWorkshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276], v. 2021-March, (Marzo 2021)en_US
dc.subject330790 Microelectrónicaen_US
dc.subject.otherFocus Quantificationen_US
dc.subject.otherHyperspectral Imagingen_US
dc.subject.otherHyperspectral Microscopyen_US
dc.subject.otherNR-IQAen_US
dc.titleBlur-Specific No-Reference Image Quality Assesment for Microscopic Hyperspectral Image Focus Quantificationen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference11th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS 2021)en_US
dc.identifier.doi10.1109/WHISPERS52202.2021.9483992en_US
dc.identifier.scopus85112801841-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid57226830782-
dc.contributor.authorscopusid57189334144-
dc.contributor.authorscopusid56405568500-
dc.contributor.authorscopusid56006321500-
dc.relation.volume2021-Marchen_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.eisbn978-1-6654-1174-5-
dc.utils.revisionen_US
dc.date.coverdateMarzo 2021en_US
dc.identifier.conferenceidevents129878-
dc.identifier.ulpgcen_US
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate24-03-2021-
crisitem.event.eventsenddate26-03-2021-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-1154-6490-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameQuintana Quintana, Laura-
crisitem.author.fullNameOrtega Sarmiento,Samuel-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
Colección:Actas de congresos
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