Please use this identifier to cite or link to this item:
https://accedacris.ulpgc.es/handle/10553/111481
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Quintana Quintana, Laura | en_US |
dc.contributor.author | Ortega Sarmiento, Samuel | en_US |
dc.contributor.author | Fabelo, Himar | en_US |
dc.contributor.author | Callicó, Gustavo M. | en_US |
dc.date.accessioned | 2021-08-31T08:49:59Z | - |
dc.date.available | 2021-08-31T08:49:59Z | - |
dc.date.issued | 2021 | en_US |
dc.identifier.isbn | 978-1-6654-3601-4 | en_US |
dc.identifier.issn | 2158-6276 | en_US |
dc.identifier.other | Scopus | - |
dc.identifier.uri | https://accedacris.ulpgc.es/handle/10553/111481 | - |
dc.description.abstract | Hyperspectral (HS) imaging is a novel technique that allows for better understanding of materials, being an improvement in multiple applications. However, one of its main drawbacks is the focus assessment. This issue has already been covered for RGB images. Thus, in this study, it is going to be revised several no reference RGB image quality assessment algorithms (NR-IQA). To this aim, a HS image database was created by capturing different images of the same specimen at different working distances. NR-IQA algorithms were tested over monochromatic images extracted from the HS images. Additionally, a study through each independent wavelength was carried out. Results showed that some algorithms perform better for calibration samples and another ones for biological samples. Furthermore, focus differences were found in the initial and final wavelengths. In conclusion, HS image results are similar to the one obtained for RGB images but, there is still room for improvement. | en_US |
dc.language | eng | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.ispartof | Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing | en_US |
dc.source | Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276], v. 2021-March, (Marzo 2021) | en_US |
dc.subject | 330790 Microelectrónica | en_US |
dc.subject.other | Focus Quantification | en_US |
dc.subject.other | Hyperspectral Imaging | en_US |
dc.subject.other | Hyperspectral Microscopy | en_US |
dc.subject.other | NR-IQA | en_US |
dc.title | Blur-Specific No-Reference Image Quality Assesment for Microscopic Hyperspectral Image Focus Quantification | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | en_US |
dc.type | ConferenceObject | en_US |
dc.relation.conference | 11th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS 2021) | en_US |
dc.identifier.doi | 10.1109/WHISPERS52202.2021.9483992 | en_US |
dc.identifier.scopus | 85112801841 | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.orcid | NO DATA | - |
dc.contributor.authorscopusid | 57226830782 | - |
dc.contributor.authorscopusid | 57189334144 | - |
dc.contributor.authorscopusid | 56405568500 | - |
dc.contributor.authorscopusid | 56006321500 | - |
dc.relation.volume | 2021-March | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.identifier.eisbn | 978-1-6654-1174-5 | - |
dc.utils.revision | Sí | en_US |
dc.date.coverdate | Marzo 2021 | en_US |
dc.identifier.conferenceid | events129878 | - |
dc.identifier.ulpgc | Sí | en_US |
item.fulltext | Sin texto completo | - |
item.grantfulltext | none | - |
crisitem.event.eventsstartdate | 24-03-2021 | - |
crisitem.event.eventsenddate | 26-03-2021 | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-1154-6490 | - |
crisitem.author.orcid | 0000-0002-7519-954X | - |
crisitem.author.orcid | 0000-0002-9794-490X | - |
crisitem.author.orcid | 0000-0002-3784-5504 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Quintana Quintana, Laura | - |
crisitem.author.fullName | Ortega Sarmiento,Samuel | - |
crisitem.author.fullName | Fabelo Gómez, Himar Antonio | - |
crisitem.author.fullName | Marrero Callicó, Gustavo Iván | - |
Appears in Collections: | Actas de congresos |
SCOPUSTM
Citations
2
checked on May 18, 2025
WEB OF SCIENCETM
Citations
1
checked on May 11, 2025
Page view(s)
158
checked on Jan 4, 2025
Google ScholarTM
Check
Altmetric
Share
Export metadata
Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.