Barrios Alfaro,Yubal

Sánchez Clemente, Antonio José ; Barrios Alfaro, Yubal ; Santos, Lucana ; Sarmiento, Roberto 
Issued date: 2019
Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019
Actas de congresos
Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Santos, Lucana ; Lopez, Sebastian ; Lopez, Jose Fco , et al
Issued date: 2018
Source: Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276],v. 2018-September
Actas de congresos