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Barrios Alfaro,Yubal ; Neris Tomé, Romén ; Guerra Hernández,Raúl Celestino ; López Suárez, Sebastián Miguel ; Sarmiento Rodríguez, Roberto Issued date: 2022 Source: DCIS 2022 - Proceedings of the 37th Conference on Design of Circuits and Integrated Systems Actas de congresos
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Barrios Alfaro, Yubal ; Guerra, Raul ; Lopez, Sebastian ; Sarmiento, Roberto Issued date: 2022 Source: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing [ISSN 1939-1404], v. 15, p. 1656-1669, (2022) SJR: 1,264 - Q1 JCR: 5,5 - Q1 SCIE MIAR ICDS: 10,6 Artículo
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Barrios Alfaro,Yubal ; Neris Tomé, Romén ; Guerra Hernández,Raúl Celestino ; López Suárez, Sebastián Miguel ; Sarmiento Rodríguez, Roberto Issued date: 2022 Source: OBPDC2022 - 8th International Workshop on OnBoard Payload Data Compression Actas de congresos
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Barrios Alfaro, Yubal ; Guerra Hernández, Raúl Celestino ; López Suárez, Sebastián ; Sarmiento Rodríguez, Roberto Issued date: 2021 Source: IEEE Geoscience and Remote Sensing Letters [ISSN 1545-598X], n. 19 SJR: 1,403 - Q1 JCR: 5,343 - Q1 SCIE MIAR ICDS: 10,7 Artículo
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Guerra Hernández, Raúl Celestino ; Barrios Alfaro, Yubal ; Díaz Martín, María ; Baez Quevedo, Abelardo ; López Suárez, Sebastián , et al Issued date: 2019 Source: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing [ISSN 1939-1404], v. 12(12), p. 4813-4828 SJR: 1,48 - Q1 JCR: 3,827 - Q1 SCIE Artículo
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Guerra, Raul ; Diaz, Maria ; Barrios Alfaro, Yubal ; Lopez, Sebastian ; Sarmiento, Roberto Issued date: 2018 Source: Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276], v. 20, p. 1- 5 18-September Actas de congresos
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Guerra, Raúl ; Barrios Alfaro, Yubal ; López, Sebastián ; Sarmiento Rodríguez, Roberto ; Diaz, Mara Issued date: 2018 Source: Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 10792 (1079208) Actas de congresos
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Guerra, Raúl ; Barrios Alfaro, Yubal ; Díaz Martín, María ; Santos, Lucana ; López, Sebastián , et al Issued date: 2018 Source: Remote Sensing [ISSN 2072-4292], v. 10 (3), 428, (2018) SJR: 1,43 - Q1 JCR: 4,118 - Q1 SCIE Artículo
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