Name 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

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Title Issue Date
Evaluation of TMR effectiveness for soft error mitigation in SHyLoC compression IP core implemented on Zynq SoC under heavy ion radiation Sánchez Clemente, Antonio José ; Barrios Alfaro, Yubal ; Santos, Lucana ; Sarmiento, Roberto Issued date: 2019 DOI: 10.1109/DFT.2019.8875281 Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 Actas de congresos

Sánchez Clemente, Antonio José ; Barrios Alfaro, Yubal ; Santos, Lucana ; Sarmiento, Roberto

Issued date: 2019

DOI: 10.1109/DFT.2019.8875281

Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

Actas de congresos