Statistics: 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

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Geo Map
Region #
NA - North America 211
AS - Asia, other 9
EU - Europe 3
Total 223
Country #
US - United States of America 211
SG - Singapore 5
DE - Germany 2
HK - Hong Kong 2
VN - Vietnam 2
RU - Russian Federation 1
Total 223
City #
San Marcos 3
Hong Kong 2
Nha Trang 2
Singapore 2
Chandler 1
Düsseldorf 1
Moscow 1
Nuremberg 1
Unknown 210
Total 223


Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Tot
2021 00 0000 0100 00 1
2022 00 0000 0001 00 1
2023 00 3000 00101 00 14
2024 1530 0022 01285 31 186
2025 53 1471 0000 00 21
Ever 223