Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/69965
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dc.contributor.authorGonzález Pérez, Franciscoen_US
dc.contributor.authorGreiner, Daviden_US
dc.contributor.authorMena, Vicenteen_US
dc.contributor.authorSouto, Ricardo M.en_US
dc.contributor.authorSantana, Juan J.en_US
dc.contributor.authorAznárez, Juan J.en_US
dc.date.accessioned2020-02-05T12:51:36Z-
dc.date.available2020-02-05T12:51:36Z-
dc.date.issued2019en_US
dc.identifier.issn0264-4401en_US
dc.identifier.otherScopus-
dc.identifier.urihttp://hdl.handle.net/10553/69965-
dc.description.abstractPurpose: Impedance data obtained by electrochemical impedance spectroscopy (EIS) are fitted to a relevant electrical equivalent circuit to evaluate parameters directly related to the resistance and the durability of metal–coating systems. The purpose of this study is to present a novel and more efficient computational strategy for the modelling of EIS measurements using the Differential Evolution paradigm. Design/methodology/approach: An alternative method to non-linear regression algorithms for the analysis of measured data in terms of equivalent circuit parameters is provided by evolutionary algorithms, particularly the Differential Evolution (DE) algorithms (standard DE and a representative of the self-adaptive DE paradigm were used). Findings: The results obtained with DE algorithms were compared with those yielding from commercial fitting software, achieving a more accurate solution, and a better parameter identification, in all the cases treated. Further, an enhanced fitting power for the modelling of metal–coating systems was obtained. Originality/value: The great potential of the developed tool has been demonstrated in the analysis of the evolution of EIS spectra due to progressive degradation of metal–coating systems. Open codes of the different differential algorithms used are included, and also, examples tackled in the document are open. It allows the complete use, or improvement, of the developed tool by researchers.en_US
dc.languageengen_US
dc.relation.ispartofEngineering Computationsen_US
dc.sourceEngineering Computations (Swansea, Wales) [ISSN 0264-4401], v. 36 (9), p. 2960-2982, (Noviembre 2019)en_US
dc.subject3313 Tecnología e ingeniería mecánicasen_US
dc.subject.otherDifferential Evolutionen_US
dc.subject.otherElectrical Equivalent Circuit Parametersen_US
dc.subject.otherElectrochemical Impedance Spectroscopyen_US
dc.subject.otherEvolutionary Algorithmsen_US
dc.subject.otherMetal–Coating Systemsen_US
dc.subject.otherModelling Studiesen_US
dc.titleFitting procedure based on Differential Evolution to evaluate impedance parameters of metal–coating systemsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1108/EC-11-2018-0513en_US
dc.identifier.scopus85069050026-
dc.identifier.isi000487013200002-
dc.contributor.authorscopusid57196059706-
dc.contributor.authorscopusid56268125800-
dc.contributor.authorscopusid57201843009-
dc.contributor.authorscopusid7005304036-
dc.contributor.authorscopusid35436067200-
dc.contributor.authorscopusid6701693105-
dc.description.lastpage2982en_US
dc.identifier.issue9-
dc.description.firstpage2960en_US
dc.relation.volume36en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid32241525-
dc.contributor.daisngid1559703-
dc.contributor.daisngid4798827-
dc.contributor.daisngid30750692-
dc.contributor.daisngid839683-
dc.contributor.daisngid31449359-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Gonzalez, F-
dc.contributor.wosstandardWOS:Greiner, D-
dc.contributor.wosstandardWOS:Mena, V-
dc.contributor.wosstandardWOS:Souto, RM-
dc.contributor.wosstandardWOS:Santana, JJ-
dc.contributor.wosstandardWOS:Aznarez, JJ-
dc.date.coverdateNoviembre 2019en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INGen_US
dc.description.sjr0,331
dc.description.jcr1,322
dc.description.sjrqQ2
dc.description.jcrqQ3
dc.description.scieSCIE
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR SIANI: Computación Evolutiva y Aplicaciones-
crisitem.author.deptIU Sistemas Inteligentes y Aplicaciones Numéricas-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUCES: Arquitectura y Concurrencia-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Señales y Comunicaciones-
crisitem.author.deptGIR Sistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.deptGIR SIANI: Modelización y Simulación Computacional-
crisitem.author.deptIU Sistemas Inteligentes y Aplicaciones Numéricas-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.orcid0000-0003-0842-0205-
crisitem.author.orcid0000-0002-4132-7144-
crisitem.author.orcid0000-0003-1755-9428-
crisitem.author.orcid0000-0002-3030-2195-
crisitem.author.orcid0000-0003-4576-7304-
crisitem.author.parentorgIU Sistemas Inteligentes y Aplicaciones Numéricas-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.parentorgIU Sistemas Inteligentes y Aplicaciones Numéricas-
crisitem.author.fullNameGonzález Pérez, Francisco-
crisitem.author.fullNameGreiner Sánchez, David Juan-
crisitem.author.fullNameMena Santana, Vicente Efigenio-
crisitem.author.fullNameSantana Rodríguez, Juan José-
crisitem.author.fullNameAznárez González, Juan José-
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