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Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/69296
DC FieldValueLanguage
dc.contributor.authorFerral, Anabellaen_US
dc.contributor.authorScavuzzo, Carlos M.en_US
dc.contributor.authorSolorza, Rominaen_US
dc.contributor.authorMarquez, Jorgeen_US
dc.contributor.authorSalvia, Mercedesen_US
dc.contributor.authorGomez-Deniz, Luisen_US
dc.contributor.authorNotarnicola, Claudiaen_US
dc.contributor.authorCigna, Francescaen_US
dc.contributor.authorMartinez, Carlos Lopezen_US
dc.contributor.authorBhattacharya, Aviken_US
dc.contributor.authorLi, Xiaofengen_US
dc.contributor.authorCamps, Adrianoen_US
dc.contributor.authorFrery, Alejandro C.en_US
dc.date.accessioned2020-01-23T14:06:44Z-
dc.date.available2020-01-23T14:06:44Z-
dc.date.issued2019en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/69296-
dc.description.abstractIn this column, we present a summary of the Third Remote Sensing Spring School at the Teófilo Tabanera Space Center, Córdoba, Argentina, 10–21 September 2018, to support the launch of the Satélite Argentino de Observación con Microondas (SAOCOM) 1A synthetic aperture radar (SAR) mission. Nearly all of the lecturers were IEEE Geoscience and Remote Sensing Society (GRSS) senior members. More than 90 specialists in a variety of areas and representing South and Central American countries and others around the world were present. Several international collaborations were proposed during discussions and meetings among participants and experts.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Geoscience and Remote Sensing Magazineen_US
dc.sourceIeee Geoscience And Remote Sensing Magazine,v. 7 (3), p. 107-109en_US
dc.subject3325 Tecnología de las telecomunicacionesen_US
dc.titleRemote Sensing Spring School in Argentina SAR for Environmental and Production Monitoringen_US
dc.typeinfo:eu-repo/semantics/annotationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/MGRS.2019.2933136
dc.identifier.scopus85072631096
dc.identifier.isi000489764400008-
dc.contributor.authorscopusid6507954946
dc.contributor.authorscopusid6603254408
dc.contributor.authorscopusid56040671200
dc.contributor.authorscopusid57201461993
dc.contributor.authorscopusid16403330400
dc.contributor.authorscopusid56789548300
dc.contributor.authorscopusid56213274700
dc.contributor.authorscopusid36720533600
dc.contributor.authorscopusid56036083300
dc.contributor.authorscopusid57213079013
dc.contributor.authorscopusid57206742665
dc.contributor.authorscopusid7005018006
dc.contributor.authorscopusid7003561251
dc.identifier.eissn2168-6831-
dc.description.lastpage109-
dc.identifier.issue3-
dc.description.firstpage107-
dc.relation.volume7-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Comentarioen_US
dc.contributor.daisngid9153795
dc.contributor.daisngid1299295
dc.contributor.daisngid8674554
dc.contributor.daisngid6872162
dc.contributor.daisngid2159837
dc.contributor.daisngid746480
dc.contributor.daisngid200847
dc.contributor.daisngid718668
dc.contributor.daisngid7087222
dc.contributor.daisngid34937464
dc.contributor.daisngid30381755
dc.contributor.daisngid27185
dc.contributor.daisngid29315664
dc.utils.revisionSíen_US
dc.contributor.wosstandardWOS:Ferral, A
dc.contributor.wosstandardWOS:Scavuzzo, CM
dc.contributor.wosstandardWOS:Solorza, R
dc.contributor.wosstandardWOS:Marquez, J
dc.contributor.wosstandardWOS:Salvia, M
dc.contributor.wosstandardWOS:Gomez-Deniz, L
dc.contributor.wosstandardWOS:Notarnicola, C
dc.contributor.wosstandardWOS:Cigna, F
dc.contributor.wosstandardWOS:Martinez, CL
dc.contributor.wosstandardWOS:Bhattacharya, A
dc.contributor.wosstandardWOS:Li, XF
dc.contributor.wosstandardWOS:Camps, A
dc.contributor.wosstandardWOS:Frery, AC
dc.date.coverdateSeptiembre 2019
dc.identifier.ulpgcSíes
dc.description.sjr3,642
dc.description.jcr13,0
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
crisitem.author.fullNameC. Frery, Alejandro-
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