Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/57514
Campo DC Valoridioma
dc.contributor.authorDíaz Martín, Maríaen_US
dc.contributor.authorGuerra Hernández, Raúl Celestinoen_US
dc.contributor.authorHorstrand, Pabloen_US
dc.contributor.authorLópez Suárez, Sebastiánen_US
dc.contributor.authorSarmiento Rodríguez, Robertoen_US
dc.date.accessioned2019-10-30T08:56:47Z-
dc.date.available2019-10-30T08:56:47Z-
dc.date.issued2019en_US
dc.identifier.issn0196-2892en_US
dc.identifier.otherWoS-
dc.identifier.urihttp://hdl.handle.net/10553/57514-
dc.description.abstractIn recent years, anomaly detection (AD) has enjoyed a growing interest in hyperspectral data analysis. However, most state-of-the-art detectors need to work with the entire hyperspectral cube, what prevents their use for applications under real-time constraints, especially when the hyperspectral data are collected by push-broom scanners that acquire the hyperspectral images (HSIs) in a line-by-line fashion. In this paper, a Line-by-Line Fast Anomaly Detector for Hyperspectral Imagery (LbL-FAD) is proposed, which is capable of processing each sensed line as soon as it is captured. The LbL-FAD works under the assumption that anomalous pixels cannot be well represented by the background distribution. It uses an orthogonal projection strategy for extracting a set of pixels from the first captured hyperspectral frames, i.e., lines of pixels, that are used for representing the background distribution. Using these pixels, the LbL-FAD proposes a hardware-friendly alternative to compute the orthogonal subspace to that spanned by the selected background samples, making the anomalous pixels better detectable. In addition, the LbL-FAD incorporates an automatic thresholding method which provides line-by-line and real-time binary maps where anomalous targets are segmented from the background. This novelty clearly differentiates the proposed LbL-FAD from the conventional anomaly detectors, which usually are not able to automatically discriminate anomalous pixels from background pixels until the entire image is processed. Several experiments have been carried out using real HSIs collected by different sensors. The obtained results clearly support the benefits of our proposal, both in terms of the accuracy of the detection performance and the computational complexity.en_US
dc.languageengen_US
dc.relationEuropean Initiative to Enable Validation for Highly Automated Safe and Secure Systemsen_US
dc.relationIniciativa Europea Para Facilitar la Validacion de Sistemas Seguros y Altamente Automatizadosen_US
dc.relationPlataforma Hw/Sw Distribuida Para El Procesamiento Inteligente de Información Sensorial Heterogenea en Aplicaciones de Supervisión de Grandes Espacios Naturalesen_US
dc.relation.ispartofIEEE Transactions on Geoscience and Remote Sensingen_US
dc.sourceIEEE Transactions on Geoscience and Remote Sensing [ISSN 0196-2892], v. 57(11), p. 8968-8982en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherAnomaly detection (AD)en_US
dc.subject.otherHyperspectral imageryen_US
dc.subject.otherLine-by-Line Fast Anomaly Detector for Hyperspectral Imagery (LbL-FAD) algorithmen_US
dc.subject.otherLine-by-line processingen_US
dc.subject.otherOrthogonal projectionsen_US
dc.subject.otherProgressive line processingen_US
dc.subject.otherPush-broom scannersen_US
dc.subject.otherReal-time applicationsen_US
dc.titleA Line-by-Line Fast Anomaly Detector for Hyperspectral Imageryen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TGRS.2019.2923921en_US
dc.identifier.scopus85071590450-
dc.identifier.isi000496155200047-
dc.contributor.authorscopusid57192832495-
dc.contributor.authorscopusid56333613300-
dc.contributor.authorscopusid54399861900-
dc.contributor.authorscopusid57187722000-
dc.contributor.authorscopusid35609452100-
dc.identifier.eissn1558-0644-
dc.description.lastpage8982en_US
dc.identifier.issue11-
dc.description.firstpage8968en_US
dc.relation.volume57en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid30892884-
dc.contributor.daisngid2216671-
dc.contributor.daisngid31090775-
dc.contributor.daisngid465777-
dc.contributor.daisngid116294-
dc.description.numberofpages15en_US
dc.utils.revisionNoen_US
dc.contributor.wosstandardWOS:Diaz, M-
dc.contributor.wosstandardWOS:Guerra, R-
dc.contributor.wosstandardWOS:Horstrand, P-
dc.contributor.wosstandardWOS:Lopez, S-
dc.contributor.wosstandardWOS:Sarmiento, R-
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr2,616
dc.description.jcr5,855
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.project.principalinvestigatorLópez Suárez, Sebastián Miguel-
crisitem.project.principalinvestigatorLópez Feliciano, José Francisco-
crisitem.project.principalinvestigatorLópez Suárez, Sebastián Miguel-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-2670-8149-
crisitem.author.orcid0000-0002-4303-3051-
crisitem.author.orcid0000-0002-2360-6721-
crisitem.author.orcid0000-0002-4843-0507-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameDíaz Martín,María-
crisitem.author.fullNameGuerra Hernández,Raúl Celestino-
crisitem.author.fullNameLópez Suárez, Sebastián Miguel-
crisitem.author.fullNameSarmiento Rodríguez, Roberto-
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