Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/55446
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dc.contributor.authorOrtega Trujillo, Sebastián Eleazaren_US
dc.contributor.authorTrujillo Pino, Agustín Rafaelen_US
dc.contributor.authorSantana, José M.en_US
dc.contributor.authorSuárez Rivero, José Pabloen_US
dc.contributor.authorSantana Almeida, Jaisiel A.en_US
dc.date.accessioned2019-05-21T08:37:08Z-
dc.date.available2019-05-21T08:37:08Z-
dc.date.issued2019en_US
dc.identifier.issn0924-2716en_US
dc.identifier.urihttp://hdl.handle.net/10553/55446-
dc.description.abstractAs the electric companies need to assure the reliability of their services, power line management gains importance during the last years. Many of them rely on LiDAR scanning of their assets to obtain the status of their power line corridors and determine possible risks. In this paper, a novel sevenfold staged pipeline is introduced to classify pylon and wire points and model the conductors. Wire points are subdivided into three categories: shield, common conductor and chain. Pylons of two different types are taken into account: suspension and anchor. For the first case, insulator strains are also identified and separated. Wire points are segmented as individual conductors and a 3D-wise model based on the catenary equation is generated for each conductor using particle swarm optimization. Tests have been conducted on a set with 25 point cloud files to assess the accuracy and correctness of the results given by the proposed pipeline.en_US
dc.languageengen_US
dc.relation.ispartofISPRS Journal of Photogrammetry and Remote Sensingen_US
dc.sourceISPRS Journal of Photogrammetry and Remote Sensing [ISSN 0924-2716], v. 152, p. 24-33en_US
dc.subject120399 Otras (especificar)en_US
dc.subject.otherPower lineen_US
dc.subject.otherClassificationen_US
dc.subject.otherPoint clouden_US
dc.subject.otherModelingen_US
dc.subject.otherProceso de señalen_US
dc.titleCharacterization and modeling of power line corridor elements from LiDAR point cloudsen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.1016/j.isprsjprs.2019.03.021
dc.identifier.scopus85063723720
dc.identifier.isi000469158200003
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.contributor.authorscopusid57191042210
dc.contributor.authorscopusid22433888800
dc.contributor.authorscopusid55349392800
dc.contributor.authorscopusid7202040282
dc.contributor.authorscopusid57198193649
dc.description.lastpage33-
dc.description.firstpage24-
dc.relation.volume152-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid6519992
dc.contributor.daisngid3861838
dc.contributor.daisngid2886117
dc.contributor.daisngid1080382
dc.contributor.daisngid7369790
dc.contributor.wosstandardWOS:Ortega, S
dc.contributor.wosstandardWOS:Trujillo, A
dc.contributor.wosstandardWOS:Santana, JM
dc.contributor.wosstandardWOS:Suarez, JP
dc.contributor.wosstandardWOS:Santana, J
dc.date.coverdateJunio 2019
dc.identifier.ulpgces
dc.description.sjr3,122
dc.description.jcr7,319
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Informática y Sistemas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0001-6212-5317-
crisitem.author.orcid0000-0002-5391-9964-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameOrtega Trujillo,Sebastián Eleazar-
crisitem.author.fullNameTrujillo Pino, Agustín Rafael-
crisitem.author.fullNameSantana Núñez, José Miguel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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